18036781. MEMORY SUB-SYSTEM LUN BYPASSING simplified abstract (Micron Technology, Inc.)
Contents
MEMORY SUB-SYSTEM LUN BYPASSING
Organization Name
Inventor(s)
Meng Wei of Pudong New District (CN)
MEMORY SUB-SYSTEM LUN BYPASSING - A simplified explanation of the abstract
This abstract first appeared for US patent application 18036781 titled 'MEMORY SUB-SYSTEM LUN BYPASSING
The method described in the abstract involves assigning initial credit values to each Logical Unit Number (LUN) of a block stripe, performing an erase operation on the block stripe, reducing the initial credit values in response to the erase operation, refraining from programming to LUNs with reduced credit values of zero, and programming to LUNs with reduced credit values greater than zero.
- Initial credit values are assigned to each LUN of a block stripe.
- An erase operation is carried out on the block stripe.
- The initial credit values are reduced by a unit increment after the erase operation.
- Programming is avoided for LUNs with reduced credit values of zero.
- Programming is done for LUNs with reduced credit values greater than zero.
Potential Applications: - This method can be applied in solid-state drives (SSDs) to optimize data programming and erase operations. - It can enhance the efficiency and longevity of storage devices by managing credit values effectively.
Problems Solved: - Efficient management of credit values in block stripes. - Preventing unnecessary programming to LUNs with zero credit values.
Benefits: - Improved performance and longevity of storage devices. - Enhanced data management capabilities in SSDs.
Commercial Applications: Title: "Optimized Data Management in Solid-State Drives" This technology can be utilized in the development of high-performance SSDs for various applications such as data centers, enterprise storage systems, and consumer electronics.
Questions about Optimized Data Management in Solid-State Drives: 1. How does this method improve the efficiency of data programming in SSDs? 2. What impact does effective credit value management have on the overall performance of storage devices?
Original Abstract Submitted
A method includes assigning a respective initial credit value to each LUN of a block stripe; performing an erase operation across the block stripe; reducing, in response to the erase operation, each respective initial credit value by a unit increment to provide a respective reduced credit value; refraining from programming to each LUN of the block stripe having a respective reduced credit value equal to zero; and programming to each LUN of the block stripe having a respective reduced credit value greater than zero.
