18023326. OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD simplified abstract (Samsung Display Co., LTD.)
Contents
OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD
Organization Name
Inventor(s)
In Hyuk Kim of Hwaseong-si (KR)
OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18023326 titled 'OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD
The abstract describes an optical inspection device with an optical measurement unit, a first probe providing a first voltage, a base frame, and a second probe providing a second voltage different from the first voltage.
- The device includes an optical measurement unit for inspection purposes.
- A first probe is positioned under the optical measurement unit and gives a first voltage.
- A base frame is located under the optical measurement unit and is spaced apart from the first probe.
- A second probe is placed on the surface of the base frame facing the first probe, providing a second voltage different from the first voltage.
- The second probe has a plate shape in plan view.
Potential Applications: - Quality control in manufacturing processes - Surface inspection in semiconductor production - Defect detection in optical components
Problems Solved: - Enables precise optical inspection - Facilitates accurate voltage measurements - Enhances quality control processes
Benefits: - Improved accuracy in inspection - Increased efficiency in manufacturing - Enhanced product quality and reliability
Commercial Applications: Title: "Advanced Optical Inspection Device for Precision Manufacturing" This technology can be used in industries such as electronics, automotive, and aerospace for quality control and defect detection in production processes. It can lead to cost savings and improved product performance.
Questions about the technology: 1. How does the optical measurement unit work in conjunction with the probes? 2. What are the specific advantages of using a second probe with a different voltage in the inspection process?
Original Abstract Submitted
An optical inspection device comprises an optical measurement unit, a first probe disposed under the optical measurement unit and providing a first voltage, a base frame disposed under the optical measurement unit and spaced apart from the first probe, and a second probe disposed on a surface of the base frame which faces the first probe, providing a second voltage different from the first voltage, and having a plate shape in plan view.
