17985501. Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging simplified abstract (General Electric Company)
Contents
- 1 Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging
Organization Name
Inventor(s)
Vamshi Krishna Reddy Kommareddy of Bangalore (IN)
Biswajit Medhi of Bangalore (IN)
Andrew Crispin Graham of Badminton (GB)
Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging - A simplified explanation of the abstract
This abstract first appeared for US patent application 17985501 titled 'Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging
Simplified Explanation
The inspection system described in the patent application includes an inspection camera, multiple light sources with different ranges of light wavelengths, and a post-processing system. The camera captures image data while the surface of interest is illuminated with directional light from the light sources. The post-processing system processes the image data into multiple images corresponding to the different ranges of light wavelengths, which can be reviewed to identify abnormal regions on the surface.
- Inspection system with camera, light sources, and post-processing system
- Light sources emit directional light with different ranges of wavelengths
- Camera captures image data while surface is illuminated
- Post-processing system generates multiple images for different light wavelengths
- Images can be reviewed to identify abnormal regions on the surface
Potential Applications
This technology can be applied in various industries for surface inspection and defect detection, such as manufacturing, quality control, and medical imaging.
Problems Solved
This technology solves the problem of efficiently detecting abnormalities on surfaces by using directional light sources and post-processing techniques to enhance image data.
Benefits
The benefits of this technology include improved accuracy in detecting surface defects, increased efficiency in inspection processes, and the ability to identify abnormalities that may not be visible under normal lighting conditions.
Potential Commercial Applications
One potential commercial application of this technology is in the automotive industry for inspecting painted surfaces for imperfections before vehicles are shipped to customers.
Possible Prior Art
One possible prior art for this technology could be similar inspection systems used in the semiconductor industry for detecting defects on silicon wafers during the manufacturing process.
Unanswered Questions
How does this technology compare to traditional surface inspection methods?
This article does not provide a direct comparison between this technology and traditional surface inspection methods.
What are the limitations of this inspection system in terms of surface materials and sizes?
This article does not address the specific limitations of the inspection system in terms of surface materials and sizes.
Original Abstract Submitted
An inspection system and related methods are provided. The inspection system includes an inspection camera, a plurality of light sources collocated with the inspection camera, and a post processing system. The plurality of light sources output directional light that have different respective ranges of light wavelengths. The inspection camera is configured to capture image data while a surface of interest is being illuminated with the directional light. Further, the post processing system is configured to receive the image data, process portions of the image data into a plurality of images that include distinct images corresponding to the different respective ranges of light wavelengths. The plurality of images can be reviewed to identify an abnormal region of the surface of interest.
