17944135. BUILT-IN SELF-TEST CIRCUITRY simplified abstract (Micron Technology, Inc.)
Contents
BUILT-IN SELF-TEST CIRCUITRY
Organization Name
Inventor(s)
Daniele Balluchi of Cernusco Sul Naviglio (IT)
Danilo Caraccio of Milano (IT)
Thomas T. Tangelder of Boise ID (US)
Jacob S. Robertson of Caldwell ID (US)
James G. Steele of Boise ID (US)
Joemar Sinipete of Boise ID (US)
BUILT-IN SELF-TEST CIRCUITRY - A simplified explanation of the abstract
This abstract first appeared for US patent application 17944135 titled 'BUILT-IN SELF-TEST CIRCUITRY
Simplified Explanation
The patent application relates to built-in self-test (BIST) circuitry for a controller coupled to multiple memory devices. The BIST circuitry includes registers to store burst patterns and can perform BIST operations on the memory devices simultaneously using these burst patterns.
- BIST circuitry for controller
- Registers to store burst patterns
- Simultaneous BIST operations on memory devices
- Multiple memory devices coupled to the controller
Potential Applications
The technology can be applied in various industries such as semiconductor manufacturing, computer hardware testing, and data storage systems.
Problems Solved
1. Efficient testing of multiple memory devices 2. Simplified testing process for controllers
Benefits
1. Improved reliability of memory devices 2. Cost-effective testing solution 3. Faster testing process
Potential Commercial Applications
Optimizing memory device testing in semiconductor manufacturing Enhancing quality control in computer hardware production Improving data storage system reliability
Possible Prior Art
One possible prior art could be the use of external testing equipment for memory device testing, which may not be as efficient or cost-effective as the built-in self-test circuitry described in the patent application.
=== What are the specific burst patterns stored in the registers for BIST operations? The specific burst patterns stored in the registers are not detailed in the abstract. Further information on the types of burst patterns used could provide insights into the testing methodology employed.
=== How does the BIST circuitry ensure accurate and reliable testing of memory devices? The abstract does not elaborate on the mechanisms through which the BIST circuitry ensures accurate and reliable testing. Exploring the specific algorithms or protocols used in the BIST operations could shed light on this aspect.
Original Abstract Submitted
Methods, systems, and devices related to built-in self-test (BIST) circuitry of a controller. The controller can be coupled to multiple memory devices. The BIST circuitry can include registers configured to store burst patterns. The BIST circuitry can perform a BIST operation on the memory devices contemporaneously and using the number of burst patterns.
