17942944. TEST MODE SECURITY CIRCUIT simplified abstract (Micron Technology, Inc.)
Contents
- 1 TEST MODE SECURITY CIRCUIT
TEST MODE SECURITY CIRCUIT
Organization Name
Inventor(s)
Kari Crane of Meridian ID (US)
Kevin G. Werhane of Kuna ID (US)
Yoshinori Fujiwara of Boise ID (US)
Jason M. Johnson of Nampa ID (US)
Takuya Tamano of Boise ID (US)
Daniel S. Miller of Boise ID (US)
TEST MODE SECURITY CIRCUIT - A simplified explanation of the abstract
This abstract first appeared for US patent application 17942944 titled 'TEST MODE SECURITY CIRCUIT
Simplified Explanation
The patent application describes an apparatus with a Test Mode (TM) control circuit that authorizes and activates various test functions within the device.
- The TM control circuit receives address information for a TM function and compares it with an authorized TM list.
- If there is a match, a latch load signal pulse is generated.
- A TM latch circuit then programs latches based on the address information and the latch load signal pulse.
- The TM latch circuit decodes the information in the latches to activate test mode operations in circuits associated with the TM function.
Potential Applications
This technology could be applied in the testing and quality control of electronic devices, ensuring that only authorized test functions are activated.
Problems Solved
This technology helps prevent unauthorized access to test functions, ensuring that only approved tests are conducted on the device.
Benefits
The apparatus provides a secure and controlled environment for testing various features of the device, enhancing overall quality control processes.
Potential Commercial Applications
"Secure Test Mode Activation Technology for Electronic Devices"
Unanswered Questions
How does the apparatus handle updates to the authorized TM list?
The patent application does not specify how new TM functions are added to the authorized list or how outdated functions are removed.
What safeguards are in place to prevent unauthorized access to the TM control circuit?
The application does not detail any security measures to protect the TM control circuit from tampering or unauthorized use.
Original Abstract Submitted
An apparatus includes a TM control circuit that is configured to receive address information corresponding to a TM function and compare the address information with an authorized TM list stored in a memory of the apparatus to determine if there is a match. If there is a match, a latch load signal pulse is output. A TM latch circuit programs one or more latches based on the address information and based on the latch load signal pulse. The TM latch circuit decodes information in the one or more latches and, based on the decoded information, outputs a test mode signal to turn on test mode operations in circuits associated with the TM function. The apparatus includes a plurality of TM functions for testing various features of the apparatus and the authorized TM list identifies which of the plurality of TM functions has been authorized for customer use.
