17938200. SEMICONDUCTOR DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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SEMICONDUCTOR DEVICES

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Changyup Park of Suwon-si (KR)

Dongho Ahn of Suwon-si (KR)

Donggeon Gu of Hwaseong-si (KR)

Wonjun Park of Hwaseong-si (KR)

Jinwoo Lee of Seoul (KR)

SEMICONDUCTOR DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 17938200 titled 'SEMICONDUCTOR DEVICES

Simplified Explanation

The abstract describes a semiconductor device that includes gate electrodes, a channel, and a resistance pattern. The gate electrodes are positioned vertically on a substrate, and the channel runs through them. The resistance pattern consists of a phase-changeable material and has specific components such as vertical extension portions, protrusion portions, and inner and outer sidewalls.

  • The gate electrodes are spaced apart vertically on a substrate.
  • The channel extends through the gate electrodes in a vertical direction.
  • The resistance pattern includes a phase-changeable material.
  • The resistance pattern has a first vertical extension portion on the channel's sidewall, extending vertically.
  • The resistance pattern also includes a first protrusion portion on the inner sidewall of the first vertical extension, protruding horizontally.
  • Additionally, there is a second protrusion portion on the outer sidewall of the first vertical extension, protruding horizontally and not overlapping the first protrusion portion.

Potential Applications

  • Semiconductor manufacturing
  • Electronics industry
  • Integrated circuits

Problems Solved

  • Improved performance and functionality of semiconductor devices
  • Enhanced control over electrical resistance in the device

Benefits

  • Higher efficiency and reliability in semiconductor devices
  • Increased flexibility in designing and optimizing circuitry
  • Potential for advancements in various electronic applications


Original Abstract Submitted

A semiconductor device includes gate electrodes on a substrate, a channel and a resistance pattern. The gate electrodes are spaced apart from each other in a vertical direction substantially perpendicular to an upper surface of the substrate. The channel extends through the gate electrodes in the vertical direction on the substrate. The resistance pattern includes a phase-changeable material. The resistance pattern includes a first vertical extension portion on a sidewall of the channel and extending in the vertical direction, a first protrusion portion on an inner sidewall of the first vertical extension portion and protruding in a horizontal direction substantially parallel to the upper surface of the substrate, and a second protrusion portion on an outer sidewall of the first vertical extension portion and protruding in the horizontal direction and not overlapping the first protrusion portion in the horizontal direction.