17925214. LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)
Contents
LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL
Organization Name
BOE TECHNOLOGY GROUP CO., LTD.
Inventor(s)
LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL - A simplified explanation of the abstract
This abstract first appeared for US patent application 17925214 titled 'LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL
The present disclosure introduces a luminous flux test circuitry, a test method, and a display panel. The circuitry consists of two test sub-circuitries, a control sub-circuitry, and a light-shielding pattern. Each test sub-circuitry contains N photosensitive transistors, with the output end of each transistor in the first sub-circuitry connected to the control sub-circuitry's first input end, and the output end of each transistor in the second sub-circuitry linked to the control sub-circuitry's second input end. The light-shielding pattern covers the photosensitive transistors in the second sub-circuitry. During the sampling stage, the photosensitive transistors in each sub-circuitry are in a reverse bias state. The control sub-circuitry is responsible for determining the luminous flux detected by the photosensitive transistors in the first sub-circuitry based on the leakage current generated by the photosensitive transistors in each sub-circuitry.
- The circuitry includes two test sub-circuitries, a control sub-circuitry, and a light-shielding pattern.
- Each test sub-circuitry has N photosensitive transistors.
- The control sub-circuitry determines the luminous flux detected by the photosensitive transistors.
- The light-shielding pattern covers the photosensitive transistors in one of the sub-circuitries.
- The photosensitive transistors are in a reverse bias state during the sampling stage.
Potential Applications: - This technology can be used in the calibration and testing of display panels. - It can be applied in the manufacturing of lighting systems to ensure accurate luminous flux measurements.
Problems Solved: - Provides a precise method for measuring luminous flux in display panels. - Offers a reliable way to calibrate lighting systems for optimal performance.
Benefits: - Enhanced accuracy in measuring luminous flux. - Improved quality control in the production of display panels and lighting systems.
Commercial Applications: Title: Advanced Luminous Flux Test Circuitry for Display Panels This technology can be utilized in the manufacturing of display panels, lighting systems, and other electronic devices that require precise luminous flux measurements. It can improve the quality control processes and ensure consistent performance in various commercial applications.
Questions about Luminous Flux Test Circuitry: 1. How does the control sub-circuitry determine the luminous flux detected by the photosensitive transistors? 2. What are the potential benefits of using this technology in display panel manufacturing?
Frequently Updated Research: Researchers are continually exploring ways to enhance the accuracy and efficiency of luminous flux measurements in various electronic devices. Stay updated on the latest advancements in this field to leverage the benefits of cutting-edge technologies.
Original Abstract Submitted
The present disclosure provides a luminous flux test circuitry, a test method and a display panel. The luminous flux test circuitry includes two test sub-circuitries, a control sub-circuitry and a light-shielding pattern. Each test sub-circuitry includes N photosensitive transistors; an output end of each photosensitive transistor in a first test sub-circuitry is coupled to a first input end of the control sub-circuitry; an output end of each photosensitive transistor in a second test sub-circuitry is coupled to a second input end of the control sub-circuitry; the light-shielding pattern covers the photosensitive transistors in the second test sub-circuitry; at a sampling stage, the photosensitive transistors in each test sub-circuitry are in a reverse bias state; and the control sub-circuitry is configured to determine a luminous flux detected by the photosensitive transistors in the first test sub-circuitry in accordance with a leakage current generated by the photosensitive transistors in each test sub-circuitry.
