17894794. TWO-TIER DEFECT SCAN MANAGEMENT simplified abstract (Micron Technology, Inc.)
Contents
TWO-TIER DEFECT SCAN MANAGEMENT
Organization Name
Inventor(s)
Kishore Kumar Muchherla of Fremont CA (US)
Robert Loren O. Ursua of Folsom CA (US)
Sead Zildzic of Rancho Cordova CA (US)
Eric N. Lee of San Jose CA (US)
Jonathan S. Parry of Boise ID (US)
Lakshmi Kalpana K. Vakati of Fremont CA (US)
Jeffrey S. Mcneil of Nampa ID (US)
TWO-TIER DEFECT SCAN MANAGEMENT - A simplified explanation of the abstract
This abstract first appeared for US patent application 17894794 titled 'TWO-TIER DEFECT SCAN MANAGEMENT
Simplified Explanation
The abstract describes a system that performs operations on data stored in memory devices, including writing data, scanning a management unit to determine a data state metric, and selecting remedial operations based on the metric.
- The system includes a processing device and memory devices.
- Operations include writing data and scanning a management unit for a data state metric.
- Each scan operation uses a predetermined read-time parameter value.
- The system determines if the data state metric meets a criterion.
- Remedial operations are selected based on the metric and the presence of redundancy metadata in fault-tolerant data stripes.
- Remedial operations are performed on the management unit.
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- Potential Applications
- Data storage systems
- Fault-tolerant computing systems
- Data management and analysis systems
- Problems Solved
- Ensuring data integrity and reliability
- Efficiently identifying and addressing data state issues
- Enhancing fault tolerance in memory devices
- Benefits
- Improved data reliability
- Enhanced fault tolerance
- Efficient data management and analysis operations
Original Abstract Submitted
A system can include a processing device operatively coupled with the one or more memory devices, to perform operations that include writing data to the one or more memory devices and performing one or more scan operations on a management unit containing the data to determine a current value of a chosen data state metric. Each scan operation can be performed using a corresponding predetermined read-time parameter value. The operations can include determining whether the current value of the chosen data state metric satisfies a criterion, and can also include, responsive to determining that the current value of the chosen data state metric satisfies the criterion, selecting a remedial operation by determining whether redundancy metadata is included in a fault tolerant data stripe on the one or more memory devices. The operations can also include performing the remedial operation with respect to the management unit.
