17874828. RELIABILITY BASED DATA VERIFICATION simplified abstract (Micron Technology, Inc.)
Contents
RELIABILITY BASED DATA VERIFICATION
Organization Name
Inventor(s)
Yu-Chung Lien of San Jose CA (US)
Ankit V. Vashi of San Jose CA (US)
Zhenming Zhou of San Jose CA (US)
Jung Sheng Hoei of Newark CA (US)
RELIABILITY BASED DATA VERIFICATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 17874828 titled 'RELIABILITY BASED DATA VERIFICATION
Simplified Explanation
The method described in the patent application involves the following steps:
1. Designating a first subset of non-volatile memory with a first reliability designation. 2. Designating a second subset of non-volatile memory blocks with a second reliability designation. 3. Configuring the first subset of non-volatile memory blocks and the second subset of non-volatile memory blocks in a first verification mode. 4. Writing data to the first subset of non-volatile memory blocks and the second subset of non-volatile memory blocks without performing write verification.
- This patent application introduces a method for organizing and writing data to non-volatile memory blocks with different reliability designations.
- The method allows for the configuration of memory blocks in a verification mode, which can enhance the efficiency of data storage and retrieval.
- By designating subsets of memory blocks with different reliability levels, the method enables the optimization of memory usage based on the importance or criticality of the data being stored.
- The absence of write verification during the writing process can improve the speed and performance of data storage operations.
Potential Applications
This technology has potential applications in various fields, including:
- Data storage systems: The method can be implemented in solid-state drives (SSDs) or other non-volatile memory devices, improving their efficiency and reliability.
- Embedded systems: It can be utilized in devices such as smartphones, tablets, and IoT devices to optimize memory usage and enhance data storage capabilities.
- Cloud computing: The method can be integrated into cloud storage systems, enabling faster and more efficient data storage and retrieval.
Problems Solved
The method described in the patent application addresses the following problems:
- Memory organization: By designating subsets of memory blocks with different reliability levels, the method solves the challenge of efficiently managing and organizing data in non-volatile memory.
- Write verification overhead: By allowing data to be written without write verification, the method reduces the overhead associated with verification processes, improving the overall performance of data storage operations.
Benefits
The technology presented in this patent application offers several benefits:
- Enhanced efficiency: By configuring memory blocks in a verification mode and optimizing their usage based on reliability designations, the method improves the efficiency of data storage and retrieval.
- Improved performance: The absence of write verification during the writing process speeds up data storage operations, resulting in improved overall system performance.
- Flexibility and customization: The ability to designate subsets of memory blocks with different reliability levels allows for customization and optimization of memory usage based on specific application requirements.
Original Abstract Submitted
A method includes designating a first subset of non-volatile memory with a first reliability designation, designating a second subset of non-volatile memory blocks with a second reliability designation, configuring the first subset of non-volatile memory blocks and the second subset of non-volatile memory blocks in a first verification mode, writing data to first subset of non-volatile memory blocks and the second subset of non-volatile memory blocks in the absence of write verification.
