17838726. METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH PROGRAMMABLE FEATURE simplified abstract (NANYA TECHNOLOGY CORPORATION)

From WikiPatents
Jump to navigation Jump to search

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH PROGRAMMABLE FEATURE

Organization Name

NANYA TECHNOLOGY CORPORATION

Inventor(s)

HSIH-YANG Chiu of TAOYUAN CITY (TW)

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH PROGRAMMABLE FEATURE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17838726 titled 'METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH PROGRAMMABLE FEATURE

Simplified Explanation

The present application describes a method for fabricating a semiconductor device. The method involves several steps, including the formation of insulative films, the implantation of dopants, and the deposition of capping layers. The key steps are as follows:

  • Forming a first insulative film on a substrate
  • Forming a first electrode on the first insulative film
  • Implanting dopants in the substrate to create first impurity regions on either side of the first electrode
  • Depositing a capping layer to cover the first electrode
  • Forming a second insulative film on exposed portions of the substrate
  • Forming a second electrode over the capping layer and portions of the second insulative film
  • Removing portions of the second insulative film on either side of the second electrode
  • Implanting dopants in exposed portions of the substrate to create second impurity regions

Potential applications of this technology:

  • Semiconductor devices, such as transistors, diodes, or integrated circuits, can benefit from this fabrication method.
  • The method can be used in the production of various electronic devices, including smartphones, computers, and televisions.

Problems solved by this technology:

  • The method provides a reliable and efficient way to fabricate semiconductor devices.
  • It allows for precise control of impurity regions, which is crucial for the performance and functionality of the devices.

Benefits of this technology:

  • The method offers improved performance and functionality of semiconductor devices.
  • It enables the production of devices with higher integration density and smaller form factors.
  • The fabrication process is more cost-effective and time-efficient compared to traditional methods.


Original Abstract Submitted

The present application provides a method of fabricating a semiconductor device. The method includes steps of forming a first insulative film on a substrate; forming a first electrode on the first insulative film; implanting dopants in the substrate to form a plurality of first impurity regions on either side of the first electrode; depositing a capping layer to cover the first electrode; forming a second insulative film on portions of the substrate exposed through the first electrode and the capping layer; forming a second electrode disposed over the capping layer and portions of the second insulative film; removing portions of the second insulative film on either side of the second electrode; and implanting dopants in portions of the substrate exposed by the second insulative film to form a plurality of second impurity regions.