17831513. SEMICONDUCTOR DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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SEMICONDUCTOR DEVICE

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Yang Xu of Seoul (KR)

Nam Kyu Cho of Yongin-si (KR)

Seok Hoon Kim of Suwon-si (KR)

Yong Seung Kim of Seongnak-si (KR)

Pan Kwi Park of Incheon (KR)

Dong Suk Shin of Suwon-si (KR)

Sang Gil Lee of Ansan-si (KR)

Si Hyung Lee of Suwon-si (KR)

SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17831513 titled 'SEMICONDUCTOR DEVICE

Simplified Explanation

The abstract describes a semiconductor device that includes several fin-shaped patterns on a substrate, a field insulating layer between the fin-shaped patterns, a source/drain pattern connected to the fin-shaped patterns, and a sealing insulating pattern.

  • The semiconductor device consists of multiple fin-shaped patterns arranged in a specific direction on a substrate.
  • A field insulating layer covers the sidewalls of the fin-shaped patterns and is placed between them.
  • A source/drain pattern is connected to the fin-shaped patterns on the field insulating layer.
  • The source/drain pattern has bottom surfaces connected to the fin-shaped patterns and at least one connection surface linking the bottom surfaces.
  • A sealing insulating pattern extends along the connection surface of the source/drain pattern and the upper surface of the field insulating layer.
  • The source/drain pattern includes a silicon-germanium pattern that is doped with a p-type impurity.

Potential applications of this technology:

  • This semiconductor device can be used in various electronic devices, such as smartphones, tablets, and computers.
  • It can be utilized in the manufacturing of integrated circuits and microprocessors.
  • The device can be employed in the development of advanced sensors and detectors.

Problems solved by this technology:

  • The fin-shaped patterns and the field insulating layer help in reducing leakage current and improving the performance of the semiconductor device.
  • The sealing insulating pattern ensures better insulation and protection of the source/drain pattern.
  • The use of a silicon-germanium pattern doped with a p-type impurity enhances the conductivity and efficiency of the device.

Benefits of this technology:

  • The semiconductor device offers improved performance and reliability due to reduced leakage current.
  • It provides better insulation and protection for the source/drain pattern, increasing the device's lifespan.
  • The use of a silicon-germanium pattern doped with a p-type impurity enhances the conductivity, leading to faster and more efficient operation.


Original Abstract Submitted

A semiconductor device including: a plurality of fin-shaped patterns spaced apart from each other in a first direction and extending in a second direction on a substrate; a field insulating layer covering sidewalls of the plurality of fin-shaped patterns and disposed between the fin-shaped patterns; a source/drain pattern connected to the plurality of fin-shaped patterns on the field insulating layer, the source/drain pattern including bottom surfaces respectively connected to the fin-shaped patterns, and at least one connection surface connecting the bottom surfaces to each other; and a sealing insulating pattern extending along the connection surface of the source/drain pattern and an upper surface of the field insulating layer, wherein the source/drain pattern includes a silicon-germanium pattern doped with a p-type impurity.