17823415. Bus Training with Interconnected Dice simplified abstract (Micron Technology, Inc.)
Contents
Bus Training with Interconnected Dice
Organization Name
Inventor(s)
Francesco Douglas Verna-ketel of Boise ID (US)
Smruti Subhash Jhaveri of Boise ID (US)
John Christopher Sancon of Boise ID (US)
Kang-Yong Kim of Boise ID (US)
Bus Training with Interconnected Dice - A simplified explanation of the abstract
This abstract first appeared for US patent application 17823415 titled 'Bus Training with Interconnected Dice
Simplified Explanation
- Apparatuses and methods for bus training with multiple dice, such as memory dice - Controller communicates with multiple dice over a bus to perform bus training - Controller sends a test pattern and receives a feedback pattern indicating detected bits - Controller may train each die separately due to differing signal timing - Logic can combine detected bits from multiple dice into a combined feedback pattern - Timing parameter suitable for multiple dice is determined for joint training - Bus training concludes when combined feedback pattern matches test pattern - Multiple dice may be stacked or linked
Potential Applications
- Memory modules - Data storage devices - Communication systems
Problems Solved
- Ensures accurate communication between multiple dice - Addresses signal timing differences between dice - Facilitates efficient bus training process
Benefits
- Improved reliability of data transmission - Simplified bus training process - Enhanced performance of memory systems
Original Abstract Submitted
Described apparatuses and methods facilitate bus training with multiple dice, such as multiple memory dice. A controller can communicate with multiple dice over a bus to perform bus training by sending a test pattern and receiving in return a feedback pattern indicative of the bits detected by the dice. Because suitable signal timing can differ between dice, even those using the same bus, the controller may attempt to train each die separately from the others. In some situations, however, individualized training may be infeasible. To accommodate such situations, logic associated with two or more dice can combine the bits as detected from the test pattern into a combined feedback pattern. A timing parameter that is jointly suitable for multiple dice can be determined, and the bus training may be concluded, responsive to the combined feedback pattern matching the test pattern. The multiple dice may be stacked or linked.
