17816894. Multi-Chain Measurement Circuit simplified abstract (Apple Inc.)
Contents
Multi-Chain Measurement Circuit
Organization Name
Inventor(s)
Joao Pedro Da Silva Cerqueira of Sunnyvale CA (US)
Pangjie Xu of San Jose CA (US)
Steven Lu of San Ramon CA (US)
Multi-Chain Measurement Circuit - A simplified explanation of the abstract
This abstract first appeared for US patent application 17816894 titled 'Multi-Chain Measurement Circuit
Simplified Explanation
The patent application describes a multi-chain measurement circuit that is used to measure the propagation of an input signal through a series of buffer circuits. Here is a simplified explanation of the abstract:
- The measurement circuit consists of two chains of buffer circuits that are connected in parallel.
- Each buffer circuit in the chains propagates an input signal.
- A set of storage circuits is used to store logic values generated by the buffer circuits in response to a clock signal transition.
- The logic values stored in the storage circuits represent the total number of storage circuits through which the input signal has propagated at the time of the clock signal transition.
- This stored digital value provides information about the propagation of the input signal through the buffer circuits.
Potential Applications:
- This multi-chain measurement circuit can be used in digital systems to measure the propagation delay of signals through different stages or components.
- It can be used in testing and debugging electronic circuits to identify delays or bottlenecks in signal propagation.
Problems Solved:
- The circuit solves the problem of accurately measuring the propagation delay of an input signal through a series of buffer circuits.
- It provides a reliable method for determining the number of buffer circuits through which the signal has propagated.
Benefits:
- The circuit allows for precise measurement of signal propagation, which is crucial for optimizing the performance of digital systems.
- It provides a cost-effective solution for measuring signal delays without the need for complex and expensive equipment.
- The circuit can be easily integrated into existing electronic systems, making it a versatile tool for testing and debugging.
Original Abstract Submitted
A multi-chain measurement circuit is disclosed. The measurement circuit includes first and second chains of serially-connected buffer circuits coupled in parallel, each of which propagates an input signal. A set of storage circuits is configured to store logic values generated by the first and second sets of buffer circuits in response to the transitioning of a clock signal. The logic values stored in the storage circuits result in a digital value indicative of a total number of serially-connected storage circuits through which the input signal has propagated at the time of the transition of the operating clock signal
