17760495. SCAN CIRCUIT AND DISPLAY APPARATUS simplified abstract (CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.)
Contents
- 1 SCAN CIRCUIT AND DISPLAY APPARATUS
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SCAN CIRCUIT AND DISPLAY APPARATUS - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Scan Circuits
- 1.13 Original Abstract Submitted
SCAN CIRCUIT AND DISPLAY APPARATUS
Organization Name
CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
Inventor(s)
SCAN CIRCUIT AND DISPLAY APPARATUS - A simplified explanation of the abstract
This abstract first appeared for US patent application 17760495 titled 'SCAN CIRCUIT AND DISPLAY APPARATUS
Simplified Explanation
The patent application describes a scan circuit with multiple stages, each containing a second processing subcircuit with specific components like capacitors and transistors.
- The scan circuit includes multiple stages, each with a second processing subcircuit.
- Each stage has a first capacitor, a sixth transistor, and a seventh transistor.
- A connecting line links the components within each stage, crossing over capacitor electrodes.
Key Features and Innovation
- Scan circuit with multiple stages.
- Second processing subcircuit in each stage.
- Specific components like capacitors and transistors in each stage.
- Connecting line linking components within each stage.
Potential Applications
The technology can be applied in various industries such as semiconductor manufacturing, integrated circuit design, and electronic testing equipment.
Problems Solved
The technology addresses the need for efficient and reliable scan circuits in complex electronic systems.
Benefits
- Improved performance and reliability of scan circuits.
- Enhanced functionality in electronic testing and data processing.
- Potential cost savings in manufacturing processes.
Commercial Applications
- Semiconductor manufacturing for efficient testing processes.
- Integrated circuit design for improved functionality.
- Electronic testing equipment for enhanced performance.
Prior Art
Readers can explore prior patents related to scan circuits, capacitors, and transistors to understand the evolution of similar technologies.
Frequently Updated Research
Stay updated on advancements in semiconductor technology, integrated circuit design, and electronic testing equipment to enhance the application of this innovation.
Questions about Scan Circuits
What are the key components of a scan circuit?
A scan circuit typically includes capacitors, transistors, and connecting lines to facilitate data processing and testing functions.
How does the second processing subcircuit enhance the performance of the scan circuit?
The second processing subcircuit in each stage of the scan circuit improves data processing speed, accuracy, and reliability by integrating specific components like capacitors and transistors.
Original Abstract Submitted
A scan circuit is provided. The scan circuit includes a plurality of stages. A respective stage of the scan circuit includes a second processing subcircuit, which includes a first capacitor, a sixth transistor, and a seventh transistor. The respective stage of the scan circuit further includes a sixth connecting line connecting a first electrode of the seventh transistor, a second electrode of the sixth transistor, and a second capacitor electrode of the first capacitor together. The sixth connecting line crosses over both the first capacitor electrode and the second capacitor electrode of the first capacitor.
