17751740. SEMICONDUCTOR DEVICES simplified abstract (Samsung Electronics Co., Ltd.)

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SEMICONDUCTOR DEVICES

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Jimin Choi of Suwon-si (KR)

Jongmin Lee of Suwon-si (KR)

Yeonjin Lee of Suwon-si (KR)

Jeonil Lee of Suwon-si (KR)

Juik Lee of Suwon-si (KR)

Minjung Choi of Suwon-si (KR)

SEMICONDUCTOR DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 17751740 titled 'SEMICONDUCTOR DEVICES

Simplified Explanation

The patent application describes a semiconductor device that includes a substrate, an etch stop layer, a through-hole electrode, and a conductive pad. The etch stop layer is positioned on the substrate and has two surfaces. The through-hole electrode extends through the substrate and the etch stop layer in a vertical direction. The conductive pad covers a protrusion portion of the through-hole electrode, which is not flat.

  • The semiconductor device includes a substrate, etch stop layer, through-hole electrode, and conductive pad.
  • The etch stop layer is positioned on the substrate and has two surfaces.
  • The through-hole electrode extends through the substrate and etch stop layer vertically.
  • The conductive pad covers a non-flat protrusion portion of the through-hole electrode.

Potential Applications

  • Semiconductor manufacturing
  • Electronics industry
  • Integrated circuits

Problems Solved

  • Provides a structure for a semiconductor device with improved electrical connections.
  • Ensures proper coverage and contact between the through-hole electrode and the conductive pad.
  • Prevents potential issues caused by a flat protrusion portion of the through-hole electrode.

Benefits

  • Enhanced electrical performance and reliability of the semiconductor device.
  • Improved manufacturing process for semiconductor devices.
  • Increased functionality and efficiency of integrated circuits.


Original Abstract Submitted

A semiconductor device includes a substrate, an etch stop layer on the substrate, a through-hole electrode extending through the substrate and the etch stop layer in a vertical direction substantially perpendicular to an upper surface of the substrate, and a conductive pad. The etch stop layer includes a first surface adjacent to the substrate and a second surface opposite the first surface. The through-hole electrode includes a protrusion portion that protrudes from the second surface of the etch stop layer. The conductive pad covers the protrusion portion of the through-hole electrode. The protrusion portion of the through-hole electrode is not flat.