The boeing company (20240344980). Microspot Reflectometer simplified abstract
Contents
- 1 Microspot Reflectometer
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 Microspot Reflectometer - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Reflectometer Technology
- 1.13 Original Abstract Submitted
Microspot Reflectometer
Organization Name
Inventor(s)
Brian Gunther of St. Louis MO (US)
James Thaddeus Wegner of St. Louis MO (US)
Jeffery Thomas Murphy of Troy MO (US)
Microspot Reflectometer - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240344980 titled 'Microspot Reflectometer
Simplified Explanation
A reflectometer is designed to test a sample by emitting a light beam onto it. The reflectometer focuses the light beam onto the sample to view its structure/defects using a detector.
- Light source emits a light beam onto the sample
- Sample holder holds the sample in place
- Light beam is focused to a reduced spot size on the sample
- Detector downstream from the sample views the structure/defects
Key Features and Innovation
- Reflectometer for testing samples
- Light beam focused to a reduced spot size
- Detector used to view structure/defects in the sample
Potential Applications
This technology can be used in various industries such as:
- Material science
- Quality control
- Semiconductor manufacturing
Problems Solved
- Allows for non-destructive testing of samples
- Enables the detection of defects in samples
Benefits
- Improved quality control
- Faster testing process
- Enhanced accuracy in detecting defects
Commercial Applications
Reflectometer for Sample Testing in Quality Control
This technology can be utilized in quality control processes across industries, ensuring the efficient and accurate testing of samples.
Prior Art
Readers can explore prior art related to reflectometers, sample testing, and defect detection in materials science and quality control industries.
Frequently Updated Research
Stay updated on the latest advancements in reflectometer technology, sample testing methods, and defect detection techniques in various industries.
Questions about Reflectometer Technology
What are the key components of a reflectometer?
A reflectometer typically consists of a light source, sample holder, focused light beam, and a detector for viewing structure/defects.
How can reflectometer technology benefit different industries?
Reflectometer technology can improve quality control processes, enhance accuracy in defect detection, and streamline sample testing across various industries.
Original Abstract Submitted
a reflectometer configured to test a sample. the reflectometer includes a light source that emits a light beam to the sample that is placed on a sample holder. the reflectometer focuses the light beam to a reduced spot size on the sample. the reflectometer is configured to view structure/defects in the sample using a detector that is downstream from the sample.
