Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract
Contents
SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE
Organization Name
Inventor(s)
Nageswara Rao Kunchapu of Bengaluru (IN)
Praveen S. Bharadwaj of Bengaluru (IN)
Somasunder Kattepura Sreenath of Bengaluru (IN)
SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240338287 titled 'SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE
The abstract describes a method for managing the inter-operability data rate range of serializer/deserializer (ser-des) test chips, which aims to double the data rate range, reduce skew on data pins, and enhance the performance in the inter-operability test of the ser-des test chip.
- Increases the inter-operability data rate range of ser-des test chips
- Reduces skew on data pins
- Improves performance in inter-operability tests
- Enhances the overall functionality of ser-des test chips
- Provides a method for managing data rate range effectively
Potential Applications: This technology can be applied in the semiconductor industry for testing and optimizing the performance of ser-des test chips. It can also be used in telecommunications and data communication systems to improve data transmission efficiency.
Problems Solved: This technology addresses the limitations in data rate range and skew on data pins of ser-des test chips, ultimately enhancing their performance and reliability in inter-operability tests.
Benefits: - Improved data rate range - Reduced skew on data pins - Enhanced performance in inter-operability tests - Increased reliability of ser-des test chips
Commercial Applications: This technology can be utilized by semiconductor companies, telecommunications providers, and data communication equipment manufacturers to enhance the performance of ser-des test chips, leading to more efficient data transmission and improved product quality.
Questions about the technology: 1. How does this method improve the performance of ser-des test chips in inter-operability tests? 2. What are the potential implications of doubling the data rate range of ser-des test chips in real-world applications?
Original Abstract Submitted
there is provided a method for managing the inter-operability data rate range of serializer/deserializer (ser-des) test chips. the method doubles the inter-operability data rate range of the ser-des test chip, reduces the skew on data pins, and thereby increases the performance in the inter-operability test of the ser-des test chip.
