Samsung electronics co., ltd. (20240319265). SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS FOR TESTING THE SAME simplified abstract
Contents
SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS FOR TESTING THE SAME
Organization Name
Inventor(s)
Seongkwan Lee of Suwon-si (KR)
Cheolmin Park of Suwon-si (KR)
SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS FOR TESTING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240319265 titled 'SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS FOR TESTING THE SAME
The abstract describes a test device for semiconductor testing, including a pulse signal generator, a sampler, a width analyzer, and a calculator.
- Pulse signal generator generates and transmits a first pulse signal through channels.
- Sampler receives the first pulse signal and conducts a sampling process based on a second pulse signal.
- Width analyzer measures the first width of the pulse signal and generates a measurement value.
- Calculator outputs a test result for each channel based on the measurement value.
Potential Applications: - Semiconductor testing in manufacturing processes. - Quality control in semiconductor production. - Research and development of semiconductor technology.
Problems Solved: - Efficient and accurate testing of semiconductors. - Streamlining the testing process. - Providing reliable data for analysis.
Benefits: - Improved accuracy in semiconductor testing. - Faster testing procedures. - Enhanced quality control in semiconductor manufacturing.
Commercial Applications: Title: Semiconductor Testing Device for Enhanced Quality Control This technology can be used in semiconductor manufacturing facilities to ensure the quality and reliability of semiconductor products. It can also be utilized in research institutions for the development of advanced semiconductor technologies.
Questions about the technology: 1. How does the sampling process improve the accuracy of semiconductor testing? 2. What are the potential cost-saving benefits of using this test device in semiconductor production?
Original Abstract Submitted
a test device for testing a semiconductor, the test device comprising: a pulse signal generator that is configured to generate a first pulse signal and transmit the first pulse signal through channels; a sampler that is configured to receive the first pulse signal through the channels and conduct a sampling process on the first pulse signal, based on a second pulse signal; a width analyzer that is configured to measure a first width of the first pulse signal and generate a first measurement value, based on a result of the sampling process; and a calculator that is configured to output a test result corresponding to each of the channels of the test device, based on the first measurement value.
