Micron technology, inc. (20240288480). CAPACITOR TEST simplified abstract
Contents
CAPACITOR TEST
Organization Name
Inventor(s)
CAPACITOR TEST - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240288480 titled 'CAPACITOR TEST
The patent application relates to a system for conducting capacitor tests, involving memory devices and external capacitors. The system includes components that initiate and perform iterations of the capacitor test, monitoring changes in the capacitor's behavior over time.
- System for conducting capacitor tests
- Components initiate and perform iterations of the test
- Monitor changes in capacitor behavior
- External capacitors connected to memory devices
- Test involves waiting, increasing discharge time, reading a counter, and analyzing counter value
Potential Applications: - Electronics manufacturing - Quality control processes - Research and development in capacitor technology
Problems Solved: - Ensuring capacitor reliability - Identifying faulty capacitors early - Streamlining testing processes
Benefits: - Improved quality control - Cost savings through early detection of faulty capacitors - Enhanced reliability of electronic devices
Commercial Applications: Title: "Advanced Capacitor Testing System for Electronics Manufacturing" This technology can be utilized in electronics manufacturing facilities to enhance quality control processes, reduce production costs, and improve the reliability of electronic devices in the market.
Questions about Capacitor Testing: 1. How does this system compare to traditional capacitor testing methods?
- The system automates and streamlines the testing process, providing more accurate and efficient results compared to manual testing methods.
2. What are the potential implications of using this technology in the electronics industry?
- The technology can lead to higher-quality electronic products, reduced warranty claims, and increased customer satisfaction.
Original Abstract Submitted
implementations described herein relate to a capacitor test. in some implementations, a system may include a memory device, one or more capacitors located externally to the memory device, and one or more components configured to initiate a capacitor test for the one or more capacitors. the one or more components may be configured to perform an iteration of the capacitor test for the one or more capacitors, wherein performing the iteration of the capacitor test comprises waiting a time period, increasing a discharge time, reading a counter associated with the capacitor test, and determining whether a value of the counter has increased. the one or more components may be configured to perform another iteration of the capacitor test or terminate the capacitor test based on determining whether the value of the counter has increased.
