Kioxia corporation (20240321566). MASS SPECTROMETER simplified abstract
Contents
MASS SPECTROMETER
Organization Name
Inventor(s)
Jun Asakawa of Yokkaichi Mie (JP)
Haruko Akutsu of Yokosuka Kanagawa (JP)
Yuki Otsuka of Yokkaichi Mie (JP)
MASS SPECTROMETER - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240321566 titled 'MASS SPECTROMETER
The patent application describes a mass spectrometer that utilizes both an ion beam and laser light to analyze samples.
- The beam irradiator emits an ion beam to irradiate a sample surface.
- The laser irradiator emits laser light to ionize particles released from the sample.
- The mass spectrometry unit detects the mass of ion particles for analysis.
- The controller adjusts the position of the laser irradiation region for optimal results.
- The controller also adjusts the position for each irradiation interval of the laser light.
Potential Applications: - Analytical chemistry - Material science research - Pharmaceutical industry for drug analysis
Problems Solved: - Enhanced sample analysis accuracy - Improved ionization efficiency - Increased sensitivity in mass spectrometry
Benefits: - Higher resolution in mass spectrometry - Faster analysis times - Greater flexibility in sample analysis
Commercial Applications: Title: Advanced Mass Spectrometer for Precision Analysis This technology can be used in laboratories, research institutions, and industries requiring high-precision sample analysis. It can revolutionize the way samples are analyzed, leading to more accurate results and faster turnaround times.
Questions about the technology: 1. How does the controller optimize the position of the laser irradiation region? - The controller uses feedback from the mass spectrometry unit to adjust the position for each irradiation interval. 2. What are the key advantages of using both an ion beam and laser light in sample analysis? - The combination allows for more comprehensive and accurate analysis of samples.
Original Abstract Submitted
a mass spectrometer includes a beam irradiator configured to emit an ion beam with pulses to irradiate a beam irradiation region along a surface of a sample; a laser irradiator configured to emit laser light with pulses to irradiate a laser irradiation region above the sample; a mass spectrometry unit configured to detects a mass of ion particles released from the sample by the ion beam and ionized by the laser light; and a controller. the controller is configured to: adjust a position of the laser irradiation region; and adjust the position of the laser irradiation region for each irradiation interval of the laser light.
