Category:Ugo Russo of Boise ID (US)
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Contents
Ugo Russo of Boise ID (US)
Executive Summary
Ugo Russo of Boise ID (US) is an inventor who has filed 1 patents. Their primary areas of innovation include {Command handling arrangements, e.g. command buffers, queues, command scheduling} (1 patents), Digital input from, or digital output to, record carriers {, e.g. RAID, emulated record carriers or networked record carriers} (1 patents), {Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]} (1 patents), and they have worked with companies such as Micron Technolgy, Inc. (1 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations).
Patent Filing Activity
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Technology Areas
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List of Technology Areas
- G06F3/0659 ({Command handling arrangements, e.g. command buffers, queues, command scheduling}): 1 patents
- G06F3/0604 (Digital input from, or digital output to, record carriers {, e.g. RAID, emulated record carriers or networked record carriers}): 1 patents
- G06F3/0679 ({Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]}): 1 patents
Companies
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List of Companies
- Micron Technolgy, Inc.: 1 patents
Collaborators
- Steven Michael Kientz of Westminster CO (US) (1 collaborations)
- Vamsi Pavan Rayaprolu of San Jose CA (US) (1 collaborations)
Subcategories
This category has the following 8 subcategories, out of 8 total.
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Pages in category "Ugo Russo of Boise ID (US)"
The following 12 pages are in this category, out of 12 total.
1
- 17823191. PARTIAL BLOCK READ VOLTAGE OFFSET simplified abstract (Micron Technology, Inc.)
- 17863000. MODIFIED READ COUNTER INCREMENTING SCHEME IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 17897869. ADJUSTMENT OF CODE RATE AS FUNCTION OF MEMORY ENDURANCE STATE METRIC simplified abstract (Micron Technology, Inc.)
- 18419895. MODIFIED READ COUNTER INCREMENTING SCHEME IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 18505855. MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract (Micron Technology, Inc.)
- 18611450. ADJUSTMENT OF CODE RATE AS FUNCTION OF MEMORY ENDURANCE STATE METRIC simplified abstract (Micron Technology, Inc.)
M
- Micron technology, inc. (20240160359). MODIFIED READ COUNTER INCREMENTING SCHEME IN A MEMORY SUB-SYSTEM simplified abstract
- Micron technology, inc. (20240161838). MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract
- Micron technology, inc. (20240185897). Assemblies Comprising Memory Cells and Select Gates; and Methods of Forming Assemblies simplified abstract
- Micron technology, inc. (20240185926). WRITING USER DATA INTO STORAGE MEMORY simplified abstract
- Micron technology, inc. (20240232013). ADJUSTMENT OF CODE RATE AS FUNCTION OF MEMORY ENDURANCE STATE METRIC simplified abstract
