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Category:Sunghwan Kim of Suwon-si (KR)
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Pages in category "Sunghwan Kim of Suwon-si (KR)"
The following 13 pages are in this category, out of 13 total.
1
- 17968328. ELECTRONIC DEVICE AND OPERATION METHOD THEREOF FOR SETTING TARGET WAKE TIME PARAMETERS BASED ON RESPONSE SIGNAL RECEIVED FROM EXTERNAL ELECTRONIC DEVICE OF DIFFERENT BASIC SERVICE SET simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18081233. ELECTRONIC DEVICE FOR PERFORMING SCANNING OF LINK AND OPERATION METHOD FOR SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18365557. METHOD AND APPARATUS FOR TRANSMITTING DATA IN MOBILE COMMUNICATION SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 18369236. SEMICONDUCTOR DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18397337. METHOD AND APPARATUS FOR UPDATING PACKET PROCESSING RULE AT HIGH SPEED IN SDN NETWORK ENVIRONMENT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18436127. SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18468317. SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18615981. ELECTRONIC DEVICE FOR PERFORMING TWT ON BASIS OF INFORMATION RELATED TO BEACON, AND OPERATING METHOD OF ELECTRONIC DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
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- Samsung electronics co., ltd. (20240128335). SEMICONDUCTOR DEVICES simplified abstract
- Samsung electronics co., ltd. (20240223507). METHOD AND APPARATUS FOR UPDATING PACKET PROCESSING RULE AT HIGH SPEED IN SDN NETWORK ENVIRONMENT simplified abstract
- Samsung electronics co., ltd. (20240237072). ELECTRONIC DEVICE FOR PERFORMING TWT ON BASIS OF INFORMATION RELATED TO BEACON, AND OPERATING METHOD OF ELECTRONIC DEVICE simplified abstract
- Samsung electronics co., ltd. (20240250000). SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240310739). SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract