Category:Qiang Zhao of Milpitas CA (US)

Qiang Zhao of Milpitas CA (US)

Executive Summary

Qiang Zhao of Milpitas CA (US) is an inventor who has filed 4 patents. Their primary areas of innovation include {for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions (electrical measurement of diffusions (2 patents), {Semiconductor wafers (manufacturing processes per se of semiconductor devices implementing a measuring step (2 patents), Details (1 patents), and they have worked with companies such as KLA Corporation (4 patents). Their most frequent collaborators include (2 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• H01L22/12 ({for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions (electrical measurement of diffusions): 2 patents
• G01N21/9501 ({Semiconductor wafers (manufacturing processes per se of semiconductor devices implementing a measuring step): 2 patents
• G01J3/0229 (Details): 1 patents
• G01J3/2823 ({Imaging spectrometer}): 1 patents
• G02F1/3532 ({Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams}): 1 patents
• G01N21/636 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G01N2021/0125 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G06T7/001 ({using an image reference approach}): 1 patents
• G01N21/95 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G06T7/55 (from multiple images): 1 patents
• G06T2207/10152 (Image acquisition modality): 1 patents
• G06T2207/30148 (Subject of image; Context of image processing): 1 patents

Companies

List of Companies

• KLA Corporation: 4 patents

Collaborators

• Ming Di of Pleasanton CA (US) (2 collaborations)
• Ming Di of Milpitas CA (US) (1 collaborations)
• Tianhao Zhang (1 collaborations)
• Dawei Hu (1 collaborations)
• Yih Chang (1 collaborations)
• Xi Chen (1 collaborations)
• Yih-Chung Chang of Davis CA (US) (1 collaborations)
• Xi Chen of Fremont CA (US) (1 collaborations)
• Dawei Hu of Milpitas CA (US) (1 collaborations)
• Ce Xu (1 collaborations)
• Bowei Huang (1 collaborations)
• Igor Baskin of San Jose CA (US) (1 collaborations)
• Mark Allen Neil of San Jose CA (US) (1 collaborations)
• Tianhao Zhang of Livermore CA (US) (1 collaborations)
• Malik Karman Sadiq of Walnut Creek CA (US) (1 collaborations)
• Shankar Krishnan of Cupertino CA (US) (1 collaborations)
• Jenching Tsai (1 collaborations)
• Carlos L. Ygartua of San Jose CA (US) (1 collaborations)
• Yao-Chung Tsao (1 collaborations)
• Ming Di of Hayward CA (US) (1 collaborations)
• Xi Chen of Milpitas CA (US) (1 collaborations)
• Shova Subedi of Milpitas CA (US) (1 collaborations)
• Tianhao Zhang of Milpitas CA (US) (1 collaborations)