18558032. POSITION MEASUREMENT SYSTEM simplified abstract (Hitachi, Ltd.)
Contents
POSITION MEASUREMENT SYSTEM
Organization Name
Inventor(s)
Tsuyoshi Kitamura of Tokyo (JP)
POSITION MEASUREMENT SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18558032 titled 'POSITION MEASUREMENT SYSTEM
The patent application describes a position measurement system that uses imaging means to capture images of objects with and without position detection units, estimating their positions and comparing them to determine the objects' locations.
- The system includes imaging means for capturing images of objects with and without position detection units.
- It has own position measurement means to determine the position of objects with position detection units.
- An image analysis means estimates the positions of all objects in the images.
- A position determination means compares the measured position of objects with position detection units to the estimated positions from the images.
- The system can determine the positions of objects without position detection units based on the comparison results.
Potential Applications: - Surveillance systems - Robotics - Autonomous vehicles - Augmented reality
Problems Solved: - Accurate position measurement of objects in various applications - Integration of position detection technology with imaging systems
Benefits: - Improved accuracy in determining object positions - Enhanced tracking capabilities - Increased efficiency in surveillance and navigation systems
Commercial Applications: Title: Advanced Position Measurement System for Surveillance and Robotics This technology can be used in industries such as security, transportation, and manufacturing for precise object tracking and positioning, leading to improved operational efficiency and safety.
Questions about the technology: 1. How does this system improve upon existing position measurement technologies? 2. What are the potential limitations of this system in real-world applications?
Original Abstract Submitted
A position measurement system comprises: a plurality of imaging means for capturing images of an own position-detecting measured object having an own position detection unit and another measured object having no own position detection unit; an own position measurement means for obtaining the position of the own position-detecting measured object on the basis of own position information from the own position detection unit; an image analysis means for estimating the positions of the own position-detecting measured object and the other measured object for each of the images; and a position determination means which compares the position of the own position-detecting measured object measured by the own position measurement means with the position of the own position-detecting measured object estimated by the image analysis means for each of the captured images, and which determines one of the positions of the other measured object estimated for the respective captured images.
