18522965. CONTROL SYSTEM AND METHOD FOR CONTROLLING MEASUREMENT PROCESSING simplified abstract (Hitachi, Ltd.)
Contents
CONTROL SYSTEM AND METHOD FOR CONTROLLING MEASUREMENT PROCESSING
Organization Name
Inventor(s)
Mineyoshi Masuda of Tokyo (JP)
CONTROL SYSTEM AND METHOD FOR CONTROLLING MEASUREMENT PROCESSING - A simplified explanation of the abstract
This abstract first appeared for US patent application 18522965 titled 'CONTROL SYSTEM AND METHOD FOR CONTROLLING MEASUREMENT PROCESSING
The abstract describes a method for controlling measurement loads to prevent degradation of application performance when detailed measurements are requested. A control system connected to a computer system manages a control policy based on the load state of the host, controlling the execution of measurement processing for acquiring internal information on the host.
- The innovation involves a control system that determines and applies a control policy when a measurement request is received, based on the load state of the host to be measured.
- The control system effectively manages the execution of measurement processing for the host to be measured, ensuring optimal performance of the application.
- By dynamically adjusting the measurement processing based on the load state of the host, the system prevents performance degradation caused by detailed measurements.
- This method allows for efficient control of measurement loads, maintaining application performance even when detailed measurements are required.
- The innovation provides a solution to the challenge of balancing detailed measurements with application performance in a computer system environment.
Potential Applications: - Data centers - Cloud computing environments - Network monitoring systems
Problems Solved: - Preventing degradation of application performance due to detailed measurements - Efficiently managing measurement loads in a computer system
Benefits: - Optimal application performance - Effective control of measurement processing - Enhanced system efficiency
Commercial Applications: Title: "Optimized Measurement Load Control System for Enhanced Application Performance" This technology can be utilized in data centers, cloud computing environments, and network monitoring systems to ensure optimal performance while conducting detailed measurements. It can be marketed to IT companies, network management firms, and cloud service providers.
Questions about Measurement Load Control System: 1. How does the control system determine the appropriate control policy based on the load state of the host? The control system analyzes the current load state of the host, considering factors such as CPU usage, memory utilization, and network traffic, to determine the most suitable control policy for managing measurement processing.
2. What are the key benefits of dynamically adjusting measurement processing based on the load state of the host? By dynamically adjusting measurement processing, the system can prevent performance degradation, optimize resource utilization, and ensure efficient operation of the application even during detailed measurements.
Original Abstract Submitted
Provided is a simple method for performing control so that a measurement load caused by detailed measurement does not degrade performance of an application in accordance with a situation in which the detailed measurement is requested. A control system is connected to a computer system in which one or more hosts that execute processes constituting an application run, and manages a control policy for controlling, according to a load state of the host, execution of measurement processing for acquiring internal information on the host. The control system determines a control policy to be applied when a measurement request is received, and controls, based on the determined control policy and the load state of the host to be measured, execution of the measurement processing for the host to be measured.
