18424999. JUNCTION TEMPERATURE ESTIMATION simplified abstract (ROLLS-ROYCE plc)
Contents
- 1 JUNCTION TEMPERATURE ESTIMATION
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 JUNCTION TEMPERATURE ESTIMATION - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Junction Temperature Estimation
- 1.13 Original Abstract Submitted
JUNCTION TEMPERATURE ESTIMATION
Organization Name
Inventor(s)
David R. Trainer of Derby (GB)
Peter J. Cox-smith of Derby (GB)
Jonathan C. Nicholls of Derby (GB)
Mark Sweet of Chesterfield (GB)
JUNCTION TEMPERATURE ESTIMATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 18424999 titled 'JUNCTION TEMPERATURE ESTIMATION
Simplified Explanation
This patent application discusses a method for estimating the junction temperatures of transistors in power electronics converters. It involves calibrating an electrical power system that includes a power electronics converter, semiconductor switches, a controller, current sensor, temperature sensor, and a junction temperature measurement module.
- The method calibrates the electrical power system by measuring the threshold voltage and temperature of transistors during switching periods.
- It updates a stored calibration to define the relationship between the rate of change of current and the estimated junction temperature of the transistor.
Key Features and Innovation
- Estimation of junction temperatures of transistors in power electronics converters.
- Calibration method for electrical power systems.
- Measurement of threshold voltage and temperature of transistors during switching periods.
- Updating stored calibration to define the relationship between current change rate and estimated junction temperature.
Potential Applications
This technology can be applied in various power electronics systems where accurate estimation of transistor junction temperatures is crucial for efficient operation and thermal management.
Problems Solved
This technology addresses the challenge of accurately estimating the junction temperatures of transistors in power electronics converters, which is essential for preventing overheating and ensuring optimal performance.
Benefits
- Improved efficiency and reliability of power electronics converters.
- Enhanced thermal management capabilities.
- Prevention of overheating and potential damage to transistors.
Commercial Applications
Title: "Advanced Junction Temperature Estimation for Power Electronics Converters" This technology can be utilized in industries such as renewable energy, electric vehicles, industrial automation, and consumer electronics for more efficient and reliable power conversion systems.
Prior Art
Readers can explore prior research on junction temperature estimation methods in power electronics converters to understand the evolution of this technology.
Frequently Updated Research
Stay updated on the latest advancements in junction temperature estimation techniques for power electronics converters to enhance the performance and reliability of electrical power systems.
Questions about Junction Temperature Estimation
How does accurate junction temperature estimation benefit power electronics converters?
Accurate junction temperature estimation helps prevent overheating, ensuring optimal performance and reliability of power electronics converters.
What are the key components involved in calibrating an electrical power system for junction temperature estimation?
The key components include semiconductor switches, a controller, current sensor, temperature sensor, and a junction temperature measurement module.
Original Abstract Submitted
An estimation of junction temperatures of transistors in power electronics converter. Example embodiments include method of calibrating electrical power system, electrical power system including: power electronics converter configured to convert between first and second voltage supplies, converter having plurality of semiconductor switches; controller configured to provide switching signals to each semiconductor switch; current sensor arranged to measure current through converter to one of first and second voltage supplies; temperature sensor arranged to measure temperature of one or more semiconductor switches; and junction temperature measurement module configured to receive current signal and temperature signal, method including: controller providing gate switching signal to transistor; junction temperature measurement module measuring threshold voltage of transistor from current signal and temperature of transistor from temperature sensor during switching period of transistor; and junction temperature measurement module updating stored calibration defining relationship between rate of change of current and estimated junction temperature of transistor.
