18403255. ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN simplified abstract (Micron Technology, Inc.)
Contents
ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN
Organization Name
Inventor(s)
Kyungjin Kim of San Jose CA (US)
ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN - A simplified explanation of the abstract
This abstract first appeared for US patent application 18403255 titled 'ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN
Simplified Explanation: The patent application describes a system component, such as a memory sub-system controller, that is configured to perform adaptive die selection for block family scan operations. The controller assigns memory components to different groups based on their storage characteristics and distributes the maximum quantity of memory components across these groups for scan operations.
- The system component, like a memory sub-system controller, is set up to select memory components for block family scan operations based on their storage characteristics.
- The controller assigns memory components to various groups, each representing different storage characteristics, to optimize the scan operations.
- It determines the maximum quantity of memory components to be used for scan operations at a specific time and distributes them across the assigned groups.
- The controller then performs block family scan operations on a portion of the memory components corresponding to the maximum quantity at that time.
Potential Applications: This technology can be applied in various industries where efficient memory management and scan operations are crucial, such as semiconductor manufacturing, data centers, and computer hardware development.
Problems Solved: This technology addresses the challenge of optimizing memory component selection for block family scan operations, ensuring efficient and effective scanning processes in complex systems.
Benefits: - Improved performance and efficiency in block family scan operations - Enhanced memory management and allocation based on storage characteristics - Streamlined processes for system components like memory sub-system controllers
Commercial Applications: The technology can be utilized in semiconductor manufacturing for optimizing memory usage, in data centers for efficient data processing, and in computer hardware development for enhancing system performance.
Prior Art: Prior research in memory management and scan operations in complex systems can provide insights into similar approaches and technologies.
Frequently Updated Research: Stay updated on advancements in memory management techniques, storage characteristics analysis, and system component optimization for improved performance.
Questions about Adaptive Die Selection for Block Family Scan Operations: 1. How does the controller determine the maximum quantity of memory components for block family scan operations? 2. What are the potential implications of this technology in the semiconductor industry?
By providing a detailed answer to these questions, readers can gain a deeper understanding of the innovative technology described in the patent application.
Original Abstract Submitted
Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to perform adaptive die selection for block family scan operations. The controller assigns a set of memory components to one or more groups of a plurality of groups based on respective storage characteristics of the set of memory components, each of the plurality of groups corresponding to different storage characteristics. The controller determines a maximum quantity of memory components to perform block family (BF) scan operations at an individual measurement period. The controller distributes the maximum quantity of memory components across the one or more groups to which the set of memory components are assigned and, at the individual measurement period, performs the BF scan operations on a portion of the set of memory components corresponding to the maximum quantity of memory components.
