18338471. ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
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ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE
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ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18338471 titled 'ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE
The abstract describes a method of testing an electronic device, involving the generation of a design for test (DFT) layout, a test pattern, and a hybrid layout by a computer based on a circuit layout.
- Computer receives a circuit layout and generates a DFT layout from it.
- Test pattern is generated using an electronic design automation (EDA) tool based on the DFT layout.
- A hybrid layout is generated from the DFT layout.
- The electronic device manufactured using the hybrid layout is tested using the test pattern.
Potential Applications: - This technology can be applied in the semiconductor industry for testing electronic devices efficiently. - It can be used in the development and manufacturing of integrated circuits to ensure quality and reliability.
Problems Solved: - Streamlines the testing process of electronic devices. - Enhances the accuracy and effectiveness of testing procedures. - Improves the overall quality control in electronic device manufacturing.
Benefits: - Increases productivity and efficiency in testing electronic devices. - Reduces the time and resources required for testing procedures. - Enhances the reliability and performance of electronic devices.
Commercial Applications: Title: Advanced Electronic Device Testing Method This technology can be utilized by semiconductor companies, electronics manufacturers, and research institutions to improve testing processes and ensure the quality of electronic devices. It has the potential to impact the market by enhancing product reliability and reducing testing costs.
Prior Art: Readers can explore prior art related to this technology by researching testing methods for electronic devices, semiconductor testing procedures, and electronic design automation tools.
Frequently Updated Research: Researchers are constantly developing new testing methodologies and tools to enhance the efficiency and accuracy of electronic device testing. Stay updated on the latest advancements in semiconductor testing technology to leverage cutting-edge solutions for electronic device manufacturing.
Questions about Electronic Device Testing Method: 1. How does this method improve the testing process for electronic devices? - This method enhances the accuracy and efficiency of testing procedures by generating optimized layouts and test patterns. 2. What are the potential applications of this technology beyond electronic device testing? - This technology can also be applied in integrated circuit development, quality control processes, and research in the semiconductor industry.
Original Abstract Submitted
Disclosed is a method of testing an electronic device, which includes receiving, by a computer, a circuit layout, generating, by the computer, a design for test (DFT) layout from the circuit layout, generating, by the computer, a test pattern by using an electronic design automation (EDA) tool, based on the DFT layout, and generating, by the computer, a hybrid layout from the DFT layout, and the electronic device manufactured by using the hybrid layout is tested by using the test pattern.
