Samsung electronics co., ltd. (20240202410). INTEGRATED CIRCUIT, APPLICATION PROCESSOR, AND DATA PROCESSING METHOD simplified abstract
Contents
INTEGRATED CIRCUIT, APPLICATION PROCESSOR, AND DATA PROCESSING METHOD
Organization Name
Inventor(s)
Joonyoung Chang of Suwon-si (KR)
INTEGRATED CIRCUIT, APPLICATION PROCESSOR, AND DATA PROCESSING METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240202410 titled 'INTEGRATED CIRCUIT, APPLICATION PROCESSOR, AND DATA PROCESSING METHOD
The abstract describes an integrated circuit with intellectual property pieces, test logics, a scanner for collecting debugging data, and an encryption circuit for converting the data into an encrypted form.
- Integrated circuit with intellectual property pieces
- Test logics for each IP piece
- Scanner to collect debugging data
- Encryption circuit to convert data into encrypted form
Potential Applications: - Secure data transmission - Debugging of complex integrated circuits - Protection of intellectual property
Problems Solved: - Data security during debugging - Efficient collection of debugging data - Protection of intellectual property
Benefits: - Enhanced data security - Streamlined debugging process - Safeguarding of intellectual property rights
Commercial Applications: - Semiconductor industry for secure data handling - Electronics manufacturing for IP protection - Technology companies for efficient debugging processes
Questions about the technology: 1. How does the encryption circuit ensure data security? 2. What are the advantages of using test logics in IP pieces?
Frequently Updated Research: - Ongoing advancements in encryption algorithms for enhanced data protection - Research on improving the efficiency of debugging processes in integrated circuits.
Original Abstract Submitted
disclosed is an integrated circuit including intellectual property (ip) pieces including test logics, respectively, a scanner configured to collect debugging data from the test logics of the ip pieces, and an encryption circuit configured to convert the debugging data into an encrypted data form.
