17985459. Inspection Systems and Methods Employing Directional Light For Enhanced Imaging simplified abstract (General Electric Company)

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Inspection Systems and Methods Employing Directional Light For Enhanced Imaging

Organization Name

General Electric Company

Inventor(s)

Vamshi Krishna Reddy Kommareddy of Bangalore (IN)

Biswajit Medhi of Bangalore (IN)

Sandeep Kumar of Bangalore (IN)

Byron Andrew Pritchard of Loveland OH (US)

Andrew Crispin Graham of Badminton (GB)

Peter John Nisbet of Bristol (GB)

Inspection Systems and Methods Employing Directional Light For Enhanced Imaging - A simplified explanation of the abstract

This abstract first appeared for US patent application 17985459 titled 'Inspection Systems and Methods Employing Directional Light For Enhanced Imaging

Simplified Explanation

The inspection system described in the patent application utilizes directional light for enhanced imaging. Here are some key points to understand the innovation:

  • The system includes an inspection camera and at least one directional light source positioned in an offset position from the camera's field of view.
  • The directional light source emits light from the offset position into the field of view, creating shadows on the surface of interest.
  • The inspection camera captures images of these shadows, which are then displayed on a display device for analysis.

Potential Applications

The technology can be used in various industries for inspection purposes, such as manufacturing, quality control, and security.

Problems Solved

This system helps in improving the imaging quality and accuracy of inspections by utilizing directional light to create shadows for better visualization of surface details.

Benefits

The use of directional light enhances imaging capabilities, leading to more accurate and detailed inspection results. This can improve efficiency and effectiveness in various inspection processes.

Potential Commercial Applications

Potential commercial applications of this technology include automated inspection systems for manufacturing, security systems for detecting anomalies, and quality control systems for ensuring product integrity.

Possible Prior Art

One possible prior art for this technology could be the use of structured light in imaging systems for creating depth maps and surface reconstructions.

Unanswered Questions

How does this technology compare to traditional inspection methods?

This article does not provide a direct comparison between this technology and traditional inspection methods.

What are the limitations of this inspection system?

The article does not address any potential limitations or challenges that may arise when implementing this inspection system.


Original Abstract Submitted

An inspection system and related methods that employ directional light for enhanced imaging are provided. The inspection system includes an inspection camera and at least one directional light source positionable in an offset position from a field of view of the inspection camera. The at least one directional light source is configured to emit directional light from the offset position into the field of view of the inspection camera so as to produce shadows on a surface of interest. Further, the inspection system includes a display device coupled to the inspection camera and the inspection camera is configured to capture one or more images of the shadows produced on the surface of interest. The display device is configured to receive and display the one or more images.