18089941. INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR A COATING simplified abstract (General Electric Company)
Contents
- 1 INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR A COATING
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR A COATING - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR A COATING
Organization Name
Inventor(s)
Aditya Kulkarni of Bengaluru (IN)
Esha Sen Gupta of Bengaluru (IN)
Vishwanath T of Bengaluru (IN)
Prasanna B K of Bengaluru (IN)
INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR A COATING - A simplified explanation of the abstract
This abstract first appeared for US patent application 18089941 titled 'INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR A COATING
Simplified Explanation
The method described in the patent application involves using electromagnetic signals to determine the microstructure of a coating on a component. By projecting signals in different planes of polarization and measuring time delays, the microstructure can be analyzed based on the differences in these time delays.
- Explanation of the patent/innovation:
* Projecting electromagnetic signals onto a coating * Measuring time delays in different planes of polarization * Analyzing the microstructure based on the differences in time delays
Potential Applications
This technology could be applied in various industries such as aerospace, automotive, and manufacturing for quality control and inspection of coatings on components.
Problems Solved
This technology helps in determining the microstructure of coatings non-destructively, providing valuable information for quality assessment and performance prediction.
Benefits
- Non-destructive analysis of coating microstructure
- Improved quality control and inspection processes
- Enhanced understanding of coating performance
Potential Commercial Applications
- Coating inspection in aerospace industry
- Quality control in automotive manufacturing
- Surface analysis in material science research
Possible Prior Art
One possible prior art could be the use of similar electromagnetic techniques for analyzing material properties in non-destructive testing applications.
Unanswered Questions
How does this method compare to traditional techniques for analyzing coating microstructure?
This article does not provide a direct comparison to traditional techniques such as microscopy or spectroscopy.
What are the limitations of this method in terms of coating thickness or composition?
The article does not address the specific limitations of this method in terms of coating thickness or composition.
Original Abstract Submitted
A method for determining a microstructure of a coating on a component. The method includes projecting at least a first electromagnetic signal in a first plane of polarization onto the coating and a second electromagnetic signal in a second plane of polarization onto the coating. A first and second time delay can be determined. The microstructure of the coating is based on a difference between at least two time delays.
