18300958. MEMORY DEVICE FOR PERFORMING FOGGY-FINE PROGRAM OPERATION AND METHOD OF OPERATING THE MEMORY DEVICE simplified abstract (SK hynix Inc.)
Contents
- 1 MEMORY DEVICE FOR PERFORMING FOGGY-FINE PROGRAM OPERATION AND METHOD OF OPERATING THE MEMORY DEVICE
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 MEMORY DEVICE FOR PERFORMING FOGGY-FINE PROGRAM OPERATION AND METHOD OF OPERATING THE MEMORY DEVICE - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
MEMORY DEVICE FOR PERFORMING FOGGY-FINE PROGRAM OPERATION AND METHOD OF OPERATING THE MEMORY DEVICE
Organization Name
Inventor(s)
Jae Yeop Jung of Icheon-si Gyeonggi-do (KR)
Dong Hun Kwak of Icheon-si Gyeonggi-do (KR)
Yeong Jo Mun of Icheon-si Gyeonggi-do (KR)
Hyun Seob Shin of Icheon-si Gyeonggi-do (KR)
MEMORY DEVICE FOR PERFORMING FOGGY-FINE PROGRAM OPERATION AND METHOD OF OPERATING THE MEMORY DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18300958 titled 'MEMORY DEVICE FOR PERFORMING FOGGY-FINE PROGRAM OPERATION AND METHOD OF OPERATING THE MEMORY DEVICE
Simplified Explanation
The memory device described in the abstract is designed to perform foggy-fine program operations on memory cells, utilizing control logic to control the peripheral circuit during the program operation.
- Memory device for foggy-fine program operation:
* Includes a memory block with multiple memory cells * Peripheral circuit performs program operations on selected memory cells * Control logic manages program operation by the peripheral circuit * Foggy program operation on first memory cells connected to a first word line * Foggy program operation on second memory cells connected to a second word line adjacent to the first word line * Fine program operation on the first memory cells by reducing verify pass voltage on the second word line
Potential Applications
The technology could be applied in: - Flash memory devices - Solid-state drives - Embedded systems
Problems Solved
- Enhancing program operations on memory cells - Improving efficiency and accuracy of programming - Reducing power consumption during program operations
Benefits
- Increased reliability of memory devices - Higher performance in data storage and retrieval - Extended lifespan of memory cells
Potential Commercial Applications
Optimizing memory devices for various industries: - Consumer electronics - Automotive systems - Medical devices
Possible Prior Art
One possible prior art could be the use of multi-level cell (MLC) technology in memory devices to increase storage capacity and efficiency.
Unanswered Questions
How does this technology compare to traditional memory programming methods?
This article does not provide a direct comparison between the foggy-fine program operation and traditional memory programming techniques. It would be helpful to understand the specific advantages and disadvantages of this new approach in relation to existing methods.
What impact does the foggy-fine program operation have on overall memory device performance?
The article does not delve into the overall performance implications of implementing foggy-fine program operations in memory devices. It would be beneficial to explore how this technology affects speed, reliability, and durability of the memory device.
Original Abstract Submitted
Provided herein is a memory device for performing a foggy-fine program operation and a method of operating the memory device. The memory device includes a memory block including a plurality of memory cells, a peripheral circuit configured to perform a program operation on selected memory cells among the plurality of cells, and a control logic configured to control the program operation by the peripheral circuit. The control logic is configured to control the peripheral circuit to perform a foggy program operation on first memory cells coupled to a first word line, among the plurality of memory cells, perform a foggy program operation on second memory cells coupled to a second word line adjacent to the first word line, among the memory cells, and perform a fine program operation on the first memory cells by decreasing a verify pass voltage to be applied to the second word line.