18174647. TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF simplified abstract (SK hynix Inc.)

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TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF

Organization Name

SK hynix Inc.

Inventor(s)

Jin Suk Oh of Gyeonggi-do (KR)

Young Jae An of Gyeonggi-do (KR)

Bok Rim Ko of Gyeonggi-do (KR)

Jae Heung Kim of Gyeonggi-do (KR)

Min Wook Oh of Gyeonggi-do (KR)

TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 18174647 titled 'TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF

Simplified Explanation

The abstract describes a test mode control circuit that includes an encryption circuit and a test mode generating circuit. The encryption circuit encrypts an access code set based on an encryption code to generate an encrypted access code set. The test mode generating circuit then generates a test mode signal based on the encrypted access code set.

  • Encryption circuit encrypts access code set
  • Test mode generating circuit generates test mode signal
  • Encryption code used to encrypt access code set
  • Test mode signal generated based on encrypted access code set

Potential Applications

The technology described in this patent application could be applied in the following areas:

  • Secure access control systems
  • Test mode functionality in electronic devices
  • Encryption-based security protocols

Problems Solved

This technology helps address the following issues:

  • Unauthorized access to sensitive information
  • Ensuring secure testing procedures
  • Preventing tampering with test modes

Benefits

The benefits of this technology include:

  • Enhanced security measures
  • Improved protection of data
  • Streamlined testing processes

Potential Commercial Applications

A potential commercial application for this technology could be in:

  • Electronic device manufacturing industry
  • Security system companies
  • Software development firms

Possible Prior Art

One possible prior art for this technology could be:

  • Encryption circuits used in access control systems
  • Test mode generating circuits in electronic devices

What are the potential security vulnerabilities of this technology and how can they be mitigated?

Potential security vulnerabilities of this technology include:

  • Encryption code being compromised
  • Test mode signal interception

To mitigate these vulnerabilities, measures such as:

  • Regularly updating encryption codes
  • Implementing secure communication protocols

How does this technology compare to existing encryption and test mode control circuits in terms of efficiency and effectiveness?

This technology offers:

  • Enhanced encryption capabilities
  • Improved test mode signal generation
  • Potential for increased security and reliability

Comparative studies on efficiency and effectiveness would be needed to provide a more detailed analysis.


Original Abstract Submitted

A test mode control circuit includes an encryption circuit and a test mode generating circuit. The encryption circuit encrypts, based on an encryption code, an access code set to generate an encrypted access code set. The test mode generating circuit generates a test mode signal based on the encrypted access code set.

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