18500841. APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT simplified abstract (SK hynix Inc.)
Contents
- 1 APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT
Organization Name
Inventor(s)
Nam Cheol Jeon of Icheon-si Gyeonggi-do (KR)
Hea Jong Yang of Icheon-si Gyeonggi-do (KR)
Tae Un Youn of Icheon-si Gyeonggi-do (KR)
APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT - A simplified explanation of the abstract
This abstract first appeared for US patent application 18500841 titled 'APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT
Simplified Explanation
The patent application describes a reliability measuring apparatus for flash memory using an ONOA current measuring circuit and a reliability indicator generator.
- The apparatus measures an ONOA current by applying a specific voltage to a word line connected to a memory cell.
- The reliability indicator is generated based on the ONOA current measured by the circuit.
Potential Applications
This technology can be applied in:
- Flash memory testing and quality control.
- Memory cell reliability assessment in electronic devices.
Problems Solved
This technology addresses:
- Ensuring the reliability and performance of flash memory.
- Providing a method for accurately measuring ONOA current in memory cells.
Benefits
The benefits of this technology include:
- Improved reliability and longevity of flash memory.
- Enhanced quality control in memory manufacturing processes.
Potential Commercial Applications
A potential commercial application for this technology could be:
- Memory chip manufacturers integrating this apparatus into their production line for quality assurance.
Possible Prior Art
One possible prior art for this technology could be:
- Existing methods for measuring current in memory cells, which may not be as accurate or reliable as the ONOA current measuring circuit.
Unanswered Questions
How does this technology compare to other methods of measuring current in memory cells?
This article does not provide a direct comparison with other current measuring techniques.
What impact could this technology have on the overall reliability of flash memory devices?
The article does not delve into the potential impact of this technology on the reliability of flash memory devices.
Original Abstract Submitted
A reliability measuring apparatus includes an oxide-nitride-oxide-alumina (ONOA) current measuring circuit configured to measure an ONOA current by applying an ONOA current measuring voltage to a selected word line coupled to a selected memory cell in a flash memory and a reliability indicator generator configured to a reliability indicator using the ONOA current measured through the measuring circuit.