17988418. Backtesting Quantum Device Calibration simplified abstract (Google LLC)
Contents
- 1 Backtesting Quantum Device Calibration
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 Backtesting Quantum Device Calibration - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
Backtesting Quantum Device Calibration
Organization Name
Inventor(s)
Paul Victor Klimov of Santa Barbara CA (US)
Backtesting Quantum Device Calibration - A simplified explanation of the abstract
This abstract first appeared for US patent application 17988418 titled 'Backtesting Quantum Device Calibration
Simplified Explanation
The abstract describes a computer-implemented method for calibrating a qubit of a quantum device by obtaining a candidate calibration model and using quantum device models to determine a simulated quantum device performance metric based on observed qubit operating characteristics.
- The method involves obtaining a candidate calibration model for calibrating the qubit.
- One or more quantum device models are used to determine a simulated quantum device performance metric.
- The simulated metric is based on log data describing observed qubit operating characteristics and associated quantum device performance metrics.
Potential Applications
This technology could be applied in quantum computing, quantum communication, and quantum sensing industries.
Problems Solved
This technology helps in accurately calibrating qubits of quantum devices, ensuring optimal performance and reliability.
Benefits
The method provides a systematic approach to qubit calibration, leading to improved quantum device performance and efficiency.
Potential Commercial Applications
Optimized Qubit Calibration Method for Enhanced Quantum Device Performance
Possible Prior Art
There may be prior art related to quantum device calibration methods using simulated performance metrics based on observed data.
What are the limitations of the proposed method in real-world quantum devices?
The abstract does not mention any potential limitations of the method when applied to real-world quantum devices.
How does this method compare to traditional qubit calibration techniques?
The abstract does not provide a comparison between this method and traditional qubit calibration techniques.
Original Abstract Submitted
An example computer-implemented method for calibrating a qubit of a quantum device is disclosed. The example method includes obtaining a candidate calibration model for calibrating an operating characteristic of the qubit. The example method includes determining, using one or more quantum device models, a simulated quantum device performance metric associated with implementation of the candidate calibration model based on log data descriptive of observed qubit operating characteristics and associated observed quantum device performance metrics.
