18926397. SYSTEM AND METHOD FOR UTILIZING TRANSFORMER DEEP LEARNING BASED OUTLIER IC DETECTION (MEDIATEK INC.)

SYSTEM AND METHOD FOR UTILIZING TRANSFORMER DEEP LEARNING BASED OUTLIER IC DETECTION

Organization Name

MEDIATEK INC.

Inventor(s)

Khim Jun Koh of Hsinchu City TW

Chi-Ming Lee of Hsinchu City TW

Yi-Ju Ting of Hsinchu City TW

Chung-Kai Chang of Hsinchu City TW

Po-Chao Tsao of Hsinchu City TW

Chin-Wei Lin of Hsinchu City TW

Yu-Lin Yang of Hsinchu City TW

Tung-Hsing Lee of Hsinchu City TW

Chin-Tang Lai of Hsinchu City TW

SYSTEM AND METHOD FOR UTILIZING TRANSFORMER DEEP LEARNING BASED OUTLIER IC DETECTION

This abstract first appeared for US patent application 18926397 titled 'SYSTEM AND METHOD FOR UTILIZING TRANSFORMER DEEP LEARNING BASED OUTLIER IC DETECTION

Original Abstract Submitted

In an aspect of the disclosure, a method for detecting outlier integrated circuits on a wafer is provided. The method comprises: operating multiple test items for each IC on the wafer to generate measured values of the multiple test items for each IC; selecting a target IC and neighboring ICs on the wafer repeatedly. each time after selecting the target IC executes the following steps: selecting a measured value of the target IC as a target measured value and selecting measured values of the target IC and the neighboring ICs as feature values of the target IC and the neighboring ICs; executing a transformer deep learning model to generate a predicted value of the target measured value; and identifying outlier ICs according to the predicted values of all the target ICs and the corresponding target measured values of all the target ICs.