19014055. MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE CHARGE LOSS STATE (Micron Technology, Inc.)
MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE CHARGE LOSS STATE
Organization Name
Inventor(s)
Patrick R. Khayat of San Diego CA US
Steven Michael Kientz of Westminster CO US
Sivagnanam Parthasarathy of Carlsbad CA US
Mustafa N. Kaynak of San Diego CA US
Vamsi Pavan Rayaprolu of San Jose CA US
MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE CHARGE LOSS STATE
This abstract first appeared for US patent application 19014055 titled 'MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE CHARGE LOSS STATE
Original Abstract Submitted
A processing device in a memory sub-system detects an occurrence of a triggering event, determines respective levels of charge loss associated with a first representative wordline of a block of a memory device and with a second representative wordline of the block of the memory device, and determines whether a difference between the respective levels of charge loss satisfies a threshold criterion. Responsive to determining that the difference between the respective levels of charge loss satisfies the threshold criterion, the processing device further determines that the block is in a uniform charge loss state.
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