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Micron technology, inc. (20250148312). ADAPTIVE CONTENT INSPECTION

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ADAPTIVE CONTENT INSPECTION

Organization Name

micron technology, inc.

Inventor(s)

Paul D. Dlugosch of Eagle ID US

Harold B Noyes of Boise ID US

ADAPTIVE CONTENT INSPECTION

This abstract first appeared for US patent application 20250148312 titled 'ADAPTIVE CONTENT INSPECTION

Original Abstract Submitted

methods and apparatus are provided involving adaptive content inspection. in one embodiment, a content inspection processor may identify information with respect to input data and provide the information to a host controller. the host controller may adapt search criteria or other parameters and provide the adapted parameter to the content inspection processor. other embodiments may include a content inspection processor having integrated feedback, such that results data is fed back to the content inspection processor. the results data may be processed before being provided to the content inspection processor.

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