Jump to content

18422018. THREE-DIMENSIONAL IMAGING SYSTEM AND THREE-DIMENSIONAL IMAGING METHOD (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)

From WikiPatents
Revision as of 11:56, 2 May 2025 by Wikipatents (talk | contribs) (Creating a new page)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)


THREE-DIMENSIONAL IMAGING SYSTEM AND THREE-DIMENSIONAL IMAGING METHOD

Organization Name

INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor(s)

Wei-Shiang Huang of Tainan City TW

Chih-Kai Chiu of Tainan City TW

Yong-Sin Syu of Kaohsiung City TW

Jhe-Ruei Li of Tainan City TW

THREE-DIMENSIONAL IMAGING SYSTEM AND THREE-DIMENSIONAL IMAGING METHOD

This abstract first appeared for US patent application 18422018 titled 'THREE-DIMENSIONAL IMAGING SYSTEM AND THREE-DIMENSIONAL IMAGING METHOD

Original Abstract Submitted

A three-dimensional imaging method includes: projecting structured light pattern on a reference plane and capturing a reference plane image of the reference plane to obtain a reference phase; projecting structured light pattern on a workpiece surface and capturing a workpiece surface image set of the workpiece surface to obtain a workpiece phase; obtaining a workpiece phase difference based on the difference between the reference phase and the workpiece phase; performing temporal binarization encoding on the workpiece surface image set to generate a coded image; detecting noise areas in the coded image; integrating the noise areas to establish a noise phase mask; filtering noises in the coded image according to the noise phase mask to generate a noise-filtered phase; compensating for the noise-filtered phase to restore the workpiece phase difference; and performing three-dimensional reconstructing on the restored workpiece phase difference to form a 3D point cloud of the workpiece surface.

Cookies help us deliver our services. By using our services, you agree to our use of cookies.