18835333. METHODS AND APPARATUSES FOR MEASUREMENT CALIBRATION INDICATOR REPORTING (Nokia Technologies Oy)
METHODS AND APPARATUSES FOR MEASUREMENT CALIBRATION INDICATOR REPORTING
Organization Name
Inventor(s)
Hyun-Su Cha of Naperville IL US
Ryan Keating of Naperville IL US
METHODS AND APPARATUSES FOR MEASUREMENT CALIBRATION INDICATOR REPORTING
This abstract first appeared for US patent application 18835333 titled 'METHODS AND APPARATUSES FOR MEASUREMENT CALIBRATION INDICATOR REPORTING
Original Abstract Submitted
Systems, methods, apparatuses, and computer program products for positioning measurement calibration are provided. One method may include obtaining calibration information of a positioning measurement, and transmitting the positioning measurement and the calibration information to a network node. The calibration information may include an indication of whether the positioning measurement is calibrated.
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