18835404. IMPACT DETERMINATION SYSTEM, IMPACT DETERMINATION METHOD, AND RECORDING MEDIUM (NEC Corporation)

IMPACT DETERMINATION SYSTEM, IMPACT DETERMINATION METHOD, AND RECORDING MEDIUM

Organization Name

NEC Corporation

Inventor(s)

Chisato Sugawara of Tokyo JP

Toshimichi Yokote of Tokyo JP

Yosuke Kimura of Tokyo JP

Yusuke Mizukoshi of Tokyo JP

Takakazu Ishii of Tokyo JP

Hiromichi Hirata of Tokyo JP

Shouhei Ohno of Tokyo JP

Nana Jumonji of Tokyo JP

IMPACT DETERMINATION SYSTEM, IMPACT DETERMINATION METHOD, AND RECORDING MEDIUM

This abstract first appeared for US patent application 18835404 titled 'IMPACT DETERMINATION SYSTEM, IMPACT DETERMINATION METHOD, AND RECORDING MEDIUM

Original Abstract Submitted

An impact determination system according to the present invention includes: a memory configured to store instructions; and one or more processors configured to execute the instructions to: acquire a predicted surface layer state of a structure after an event, the predicted surface layer state being sensor information related to a surface of the structure on a ground surface and having been predicted based on pre-event sensor information measured before the event related to a ground of the structure; acquire post-event sensor information measured after the event; determine a post-event surface layer state of the structure based on the post-event sensor information; and determine an impact of the event on the structure based on the predicted surface layer state and the post-event surface layer state.