APPARATUS AND METHOD

Organization Name

Inventor(s)

Damian Paul Tootell of MIDDLEWICH CHESHIRE (GB)

Anthony Michael Jones of MIDDLEWICH CHESHIRE (GB)

APPARATUS AND METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240014022 titled 'APPARATUS AND METHOD

Simplified Explanation

The abstract describes an ion source for a static gas mass spectrometer. The ion source includes a source block that receives a sample gas, an electron source that ionizes the sample gas, a set of electrodes between the electron source and the source block, and a controller that controls the voltage applied to the electrodes to regulate the flux of electrons into the source block during different time periods.

The ion source is designed for a static gas mass spectrometer.
The source block receives the sample gas.
The electron source provides a flux of electrons to ionize the sample gas.
The electrodes, including a first electrode, are positioned between the electron source and the source block.
The controller controls the voltage applied to the first electrode to regulate the flux of electrons into the source block.
During the first time period after receiving the sample gas, the flux of electrons is attenuated into the source block.
During the second time period following the first time period, the flux of electrons is permitted into the source block.

Potential applications of this technology:

Gas analysis: The ion source can be used in gas mass spectrometry to analyze the composition of gases.
Environmental monitoring: It can be used to detect and analyze pollutants in the air or water.
Industrial processes: The ion source can be applied in various industrial processes to monitor gas composition and ensure quality control.

Problems solved by this technology:

Accurate ionization: The ion source provides controlled ionization of the sample gas, ensuring accurate analysis.
Time-dependent control: The voltage control allows for precise regulation of the flux of electrons during different time periods, improving the reliability of the analysis.

Benefits of this technology:

Improved accuracy: The controlled ionization process enhances the accuracy of gas analysis results.
Versatility: The ion source can be used for various gas analysis applications in different industries.
Time-dependent control: The ability to regulate the flux of electrons during different time periods provides flexibility and customization in the analysis process.

Original Abstract Submitted

an ion source () for a static gas mass spectrometer is described. the ion source () comprises: a source block () defining a volume v to receive a sample gas g; an electron source () in fluid communication with the source block () and configured to provide a flux of electrons e therein for ionising the sample gas g; a set of electrodes (), including a first electrode (a), disposed between the electron source () and the source block (); and a controller (not shown) configured to control a voltage applied to the first electrode (a) to attenuate the flux of the electrons e into the source block () during a first time period following receiving of the sample gas g in the source block () and to permit the flux of the electrons e into the source block () during a second time period following the first time period.

20240014022. APPARATUS AND METHOD simplified abstract (ISOTOPX LTD)