18334363. METHOD AND APPARATUS TO MIGRATE MORE SENSITIVE WORKLOADS TO FASTER CHIPLETS (Advanced Micro Devices, Inc.)
Contents
METHOD AND APPARATUS TO MIGRATE MORE SENSITIVE WORKLOADS TO FASTER CHIPLETS
Organization Name
Inventor(s)
Ashkan Hosseinzadeh Namin of Richmond Hill (CA)
METHOD AND APPARATUS TO MIGRATE MORE SENSITIVE WORKLOADS TO FASTER CHIPLETS
This abstract first appeared for US patent application 18334363 titled 'METHOD AND APPARATUS TO MIGRATE MORE SENSITIVE WORKLOADS TO FASTER CHIPLETS
Original Abstract Submitted
An apparatus and method for efficiently performance among replicated functional blocks of an integrated circuit despite different circuit behavior amongst the functional blocks due to manufacturing variations. An integrated circuit includes multiple replicated functional blocks, each being a semiconductor die with an instantiated copy of particular integrated circuitry for processing a work block. One or more of the functional blocks of the integrated circuit belong in a different performance category or bin than other functional blocks due to manufacturing variations across semiconductor dies. A scheduler assigns work blocks to the functional blocks based on whether a functional block is from a high-performance bin and whether a workload of a work block is a computation intensive workload. The scheduler assigns work blocks work blocks marked as having a memory access intensive workload to functional blocks from a lower performance bin.
