18690668. AUGMENTED-FIELD-OF-VIEW, HIGH-RESOLUTION OPTICAL MICROSCOPY METHOD AND OPTICAL MICROSCOPE (CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE)
Contents
AUGMENTED-FIELD-OF-VIEW, HIGH-RESOLUTION OPTICAL MICROSCOPY METHOD AND OPTICAL MICROSCOPE
Organization Name
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
Inventor(s)
Pierre Nassoy of BORDEAUX (FR)
AUGMENTED-FIELD-OF-VIEW, HIGH-RESOLUTION OPTICAL MICROSCOPY METHOD AND OPTICAL MICROSCOPE
This abstract first appeared for US patent application 18690668 titled 'AUGMENTED-FIELD-OF-VIEW, HIGH-RESOLUTION OPTICAL MICROSCOPY METHOD AND OPTICAL MICROSCOPE
Original Abstract Submitted
The invention relates to an optical microscope () and a microscopy method. According to the invention, the microscope comprises an imaging module () comprising an optical beam splitter (), a first optical system (), a first camera (), a second optical system () and a second camera (), the second optical system () and the second camera () being configured to acquire a low-magnification image, and the first optical system () comprising a reflective scanning device () placed in a plane () optically conjugate with the Fourier plane () of the optical microscope (), a controller () being configured to angularly orient the reflective scanning device () so that the first camera () acquires at least one first image (N) of a portion of the object field of the microscope objective ().
