18665744. METHOD OF GENERATING AN ANOMALIES DETECTION MODEL AND METHOD OF DETECTING ANOMALIES USING SUCH MODEL (STMicroelectronics International N.V.)
Contents
METHOD OF GENERATING AN ANOMALIES DETECTION MODEL AND METHOD OF DETECTING ANOMALIES USING SUCH MODEL
Organization Name
STMicroelectronics International N.V.
Inventor(s)
Mohamed Ali Moussa of Toulon (FR)
METHOD OF GENERATING AN ANOMALIES DETECTION MODEL AND METHOD OF DETECTING ANOMALIES USING SUCH MODEL
This abstract first appeared for US patent application 18665744 titled 'METHOD OF GENERATING AN ANOMALIES DETECTION MODEL AND METHOD OF DETECTING ANOMALIES USING SUCH MODEL
Original Abstract Submitted
According to one aspect, a computer-implemented method can be used for producing an anomaly detection model. The method includes obtaining a learning data stream from a physical system, incrementally computing principal components of the learning data stream, performing orthonormalization of the principal components computed so as to obtain an orthonormal base representing the learning data stream, and producing the anomaly detection model including the orthonormal base and a detection threshold defined by a user. The anomaly detection model can then be applied to a physical system.
