Taiwan semiconductor manufacturing company, ltd. (20240378163). SYSTEMS AND METHODS OF TESTING MEMORY DEVICES simplified abstract
Contents
SYSTEMS AND METHODS OF TESTING MEMORY DEVICES
Organization Name
taiwan semiconductor manufacturing company, ltd.
Inventor(s)
Meng-Han Lin of Hsinchu City (TW)
Chia-En Huang of Xinfeng Township (TW)
SYSTEMS AND METHODS OF TESTING MEMORY DEVICES - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240378163 titled 'SYSTEMS AND METHODS OF TESTING MEMORY DEVICES
The memory device described in the abstract includes a first memory block with a unique structure for efficient data storage and retrieval.
- The first memory block consists of a first memory sub-array and a first interface portion with a staircase profile of control structures.
- A series of interconnect structures connect the control structures to transistors, facilitating data transfer within the memory block.
- Test structures are included to simulate electrical connections and ensure proper functionality of the memory device.
- The test structures are isolated from the memory block but are interconnected to each other for testing purposes.
Potential Applications: - This memory device could be used in various electronic devices such as smartphones, computers, and servers. - It could also be applied in data storage systems, IoT devices, and automotive electronics.
Problems Solved: - The innovative design of the memory block improves data access speed and efficiency. - The test structures help in identifying and resolving any electrical connection issues within the memory device.
Benefits: - Enhanced performance and reliability of data storage and retrieval processes. - Simplified testing procedures for ensuring the functionality of the memory device.
Commercial Applications: - The memory device could be marketed to manufacturers of electronic devices and data storage solutions. - It has the potential to improve the overall performance of various technological applications.
Prior Art: - Researchers and developers in the field of memory devices may find relevant information in studies related to memory block structures and testing methods.
Frequently Updated Research: - Stay updated on advancements in memory device technology, particularly in the areas of data storage efficiency and testing methodologies.
Questions about Memory Device Technology: 1. How does the unique structure of the memory block contribute to its efficiency and performance? 2. What are the specific advantages of using test structures in ensuring the functionality of the memory device?
Original Abstract Submitted
a memory device includes a first memory block. the first memory block includes a first memory sub-array and a first interface portion disposed next to the first memory sub-array. the first interface portion has a plurality of first control structures formed as a first staircase profile. the first memory block further includes a plurality of first interconnect structures landing on a corresponding one of the plurality of first control structures, and a plurality of second interconnect structures configured to electrically couple a corresponding one of the plurality of first interconnect structures to a first transistor. the memory device further includes a first test structure and a second test structure disposed next to the first memory block, each configured to simulate electrical connections of the plurality of second interconnect structures. the first and second test structures are electrically coupled to each other and are electrically isolated form the first memory block.
