Samsung electronics co., ltd. (20240355580). TRANSMISSION ELECTRON MICROSCOPE IMAGE PROCESSING APPARATUS, FACILITY SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF simplified abstract
TRANSMISSION ELECTRON MICROSCOPE IMAGE PROCESSING APPARATUS, FACILITY SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF
Organization Name
Inventor(s)
Byeongkyu Cha of Suwon-si (KR)
TRANSMISSION ELECTRON MICROSCOPE IMAGE PROCESSING APPARATUS, FACILITY SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240355580 titled 'TRANSMISSION ELECTRON MICROSCOPE IMAGE PROCESSING APPARATUS, FACILITY SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF
Simplified Explanation: The patent application describes a method for operating a transmission electron microscope (TEM) image processing apparatus, which involves acquiring a TEM image, performing weak labeling on the image, generating ground truth using a guide model, segmenting the image using training data, measuring a device core structure based on the segmentation result, visualizing the measurement result according to the device core structure, and storing the data in a database.
Key Features and Innovation:
- Acquiring TEM images from a TEM facility.
- Performing weak labeling on the acquired images.
- Generating ground truth using a guide model for partially labeled images.
- Segmenting images using training data.
- Measuring device core structures based on segmentation results.
- Visualizing measurement results according to device core structures.
- Storing data in a database for future reference.
Potential Applications: This technology can be used in various fields such as materials science, nanotechnology, biology, and semiconductor industry for analyzing and measuring structures at the nanoscale level.
Problems Solved: This technology addresses the challenges of accurately measuring and analyzing structures in TEM images, especially at the nanoscale level, by providing a systematic approach for image processing and analysis.
Benefits:
- Improved accuracy in measuring device core structures.
- Enhanced visualization of measurement results.
- Efficient storage and retrieval of data for future reference.
- Streamlined image processing workflow for TEM analysis.
Commercial Applications: The technology can be applied in research institutions, semiconductor companies, materials science labs, and nanotechnology facilities for advanced image processing and analysis in TEM studies.
Prior Art: Readers can explore prior art related to image processing in transmission electron microscopy by looking into research papers, patents, and academic journals in the field of microscopy and nanotechnology.
Frequently Updated Research: Researchers are constantly developing new algorithms and techniques for image processing in transmission electron microscopy to enhance the accuracy and efficiency of analyzing nanoscale structures.
Questions about Transmission Electron Microscope (TEM) Image Processing: 1. How does weak labeling improve the analysis of TEM images?
- Weak labeling helps in providing initial information about the image content, which can guide further processing and analysis.
2. What are the key challenges in segmenting TEM images for measuring device core structures?
- The main challenges include noise reduction, accurate boundary detection, and handling complex structures in the images.
Original Abstract Submitted
a method of operating a transmission electron microscope (tem) image processing apparatus, includes acquiring a tem image from a tem facility, performing weak labeling of the tem image, generating ground truth for a partially labeled tem image using a guide model, performing segmentation using training data consisting of a pair of the tem image and the ground truth; measuring a device core structure according to a result of the segmentation, and visualizing a measurement result according to the device core structure, and storing the same in a database.
