Samsung electronics co., ltd. (20240353958). CONTINUOUS TACTILE FEEDBACK FOR ELECTRONIC DEVICES simplified abstract

From WikiPatents
Revision as of 05:55, 25 October 2024 by Wikipatents (talk | contribs) (Creating a new page)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search

CONTINUOUS TACTILE FEEDBACK FOR ELECTRONIC DEVICES

Organization Name

samsung electronics co., ltd.

Inventor(s)

Francois Robert Hogan of St-Jean-Sur-Richelieu (CA)

Trevor Ablett of Toronto (CA)

Xue Liu of Montreal (CA)

Gregory Lewis Dudek of Westmount (CA)

Amal Feriani of Winnipeg (CA)

CONTINUOUS TACTILE FEEDBACK FOR ELECTRONIC DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240353958 titled 'CONTINUOUS TACTILE FEEDBACK FOR ELECTRONIC DEVICES

Simplified Explanation

The method described in the patent application involves using an electronic device to capture an image of markers, detect their arrangement, measure their deformation, and generate input commands to control the device.

Key Features and Innovation

  • Obtaining an image of markers
  • Detecting the arrangement of markers
  • Measuring deformation of markers
  • Generating input commands based on measurements
  • Transforming signals into input commands

Potential Applications

This technology could be used in various industries such as:

  • Augmented reality
  • Robotics
  • Medical imaging
  • Quality control

Problems Solved

  • Efficient measurement of deformations
  • Accurate detection of marker arrangements
  • Seamless control of electronic devices

Benefits

  • Improved accuracy in measurements
  • Enhanced control of electronic devices
  • Streamlined processes in various industries

Commercial Applications

  • "Marker-based Deformation Measurement and Control System" could be marketed to companies in the fields of robotics, augmented reality, and medical imaging for improved accuracy and control in their operations.

Prior Art

Prior art related to marker-based deformation measurement and control systems can be found in research papers and patents in the fields of computer vision, robotics, and medical imaging.

Frequently Updated Research

Researchers are constantly exploring new applications and improvements in marker-based deformation measurement and control systems, so staying updated on the latest advancements in these fields is crucial.

Questions about Marker-Based Deformation Measurement and Control Systems

How does this technology improve accuracy in measurements?

This technology enhances accuracy by detecting marker arrangements and measuring deformations with precision, leading to more reliable data for analysis and control.

What industries can benefit from marker-based deformation measurement and control systems?

Industries such as robotics, augmented reality, medical imaging, and quality control can benefit from the accurate measurements and control provided by this technology.


Original Abstract Submitted

a method performed by an electronic device, includes: obtaining an image of a set of markers; based on the image, detecting an arrangement of the set of markers; based on the arrangement of the set of markers, performing a measurement about a deformation of the set of markers; based on the measurement about the deformation of the set of markers, generating a plurality of signals; transforming the plurality of signals to a plurality of input commands. the plurality of input commands are used to control the electronic device.