Samsung electronics co., ltd. (20240353486). STORAGE SYSTEM AND AN OPERATING METHOD THEREOF simplified abstract

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STORAGE SYSTEM AND AN OPERATING METHOD THEREOF

Organization Name

samsung electronics co., ltd.

Inventor(s)

Ganggyu Lee of Suwon-si (KR)

Insup Kim of Suwon-si (KR)

STORAGE SYSTEM AND AN OPERATING METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240353486 titled 'STORAGE SYSTEM AND AN OPERATING METHOD THEREOF

The abstract describes a storage system that includes a storage device, a diagnosis circuit, and a debugging port. The diagnosis circuit generates a test pattern, sends it to the storage device, receives result data, and tests the device's normal operation. The debugging port connects to the diagnosis circuit, receives power from an external device, supplies power to the diagnosis circuit, and transfers data from the storage device to the external device.

  • Storage system with diagnosis and debugging capabilities
  • Diagnosis circuit generates test patterns and checks storage device operation
  • Debugging port connects to diagnosis circuit for power and data transfer
  • External device provides auxiliary power to the debugging port
  • System ensures proper functioning of the storage device

Potential Applications: - Data storage systems - Computer hardware testing - Device troubleshooting

Problems Solved: - Ensuring storage device functionality - Efficient diagnosis and debugging process

Benefits: - Improved reliability of storage systems - Streamlined testing and troubleshooting procedures

Commercial Applications: Title: "Advanced Storage System with Diagnosis and Debugging Capabilities" This technology can be used in industries such as data storage, computer hardware manufacturing, and IT services. It offers a reliable solution for testing and maintaining storage devices, leading to increased efficiency and reduced downtime.

Questions about the technology: 1. How does the diagnosis circuit generate and compare test patterns? The diagnosis circuit generates test patterns and compares them with result data to determine the normal operation of the storage device. 2. What is the role of the debugging port in the storage system? The debugging port connects to the diagnosis circuit, receives power from an external device, and facilitates data transfer between the storage device and external devices.


Original Abstract Submitted

a storage system including: a storage device; a diagnosis circuit that generates a test pattern, transmits the test pattern to the storage device, receives result data corresponding to the test pattern from the storage device, and tests whether the storage device normally operates by comparing the test pattern with the result data; and a debugging port that is connected to the diagnosis circuit, receives auxiliary power from an external device, supplies the auxiliary power to the diagnosis circuit, and transmits data in the storage device to the external device.