Samsung electronics co., ltd. (20240353442). PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE SAME simplified abstract
Contents
PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE SAME
Organization Name
Inventor(s)
Kyoungmin Lee of Suwon-si (KR)
Junnyeong Cho of Suwon-si (KR)
PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240353442 titled 'PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE SAME
The abstract describes a probe card and a semiconductor device inspection system. The probe card includes a socket structure with at least one socket and a plane structure. The socket has at least one RF signal pin and at least one ground pin. The plane structure includes an RF plane with at least one RF signal line connected to the RF signal pin, and a ground plane connected to the ground pin, located between the RF plane and the socket structure.
- The probe card includes a socket structure with at least one socket and a plane structure.
- The socket structure has at least one RF signal pin and at least one ground pin.
- The plane structure includes an RF plane with at least one RF signal line connected to the RF signal pin.
- A ground plane is connected to the ground pin and is located between the RF plane and the socket structure.
- The system allows for the transmission of signals in the radio frequency (RF) band for semiconductor device inspection.
Potential Applications: - Semiconductor device testing and inspection - Quality control in semiconductor manufacturing
Problems Solved: - Efficient transmission of RF signals during semiconductor device inspection - Improved accuracy and reliability in testing procedures
Benefits: - Enhanced performance in semiconductor device testing - Increased productivity and accuracy in manufacturing processes
Commercial Applications: Title: Semiconductor Device Inspection System for Enhanced Testing Procedures This technology can be used in semiconductor manufacturing facilities to improve testing procedures, leading to higher quality control and increased productivity. The system can be marketed to companies in the semiconductor industry looking to enhance their testing capabilities.
Questions about Semiconductor Device Inspection System: 1. How does the probe card improve the efficiency of semiconductor device testing? The probe card allows for the transmission of signals in the RF band, enabling accurate and reliable testing procedures. 2. What are the potential benefits of using this system in semiconductor manufacturing? Using this system can lead to improved performance, increased productivity, and enhanced quality control in semiconductor manufacturing processes.
Original Abstract Submitted
provided are a probe card and a semiconductor device inspection system including the same. a probe card includes a socket structure including at least one socket, and a plane structure located on the socket structure. the at least one socket includes at least one rf signal pin through which a signal of a radio frequency (rf) band is transmitted, and at least one ground pin. the plane structure includes an rf plane including at least one rf signal line electrically connected to the at least one rf signal pin, and a ground plane electrically connected to the at least one ground pin, the ground plane being located between the rf plane and the socket structure.
